scholarly journals TUNABLE BANDPASS FILTER USING RF MEMS SWITCHES

2010 ◽  
Vol 10 (2) ◽  
pp. 69-80
Author(s):  
A.H.M Zahirul Alam

A band pass tunable RF filter is proposed by using Radio Frequency (RF) Microelectro Mechanical Systems (MEMS). The tunability is obtained by using capacitive MEMS switches that can be tuned within the bandwidth of 3.6 GHz to 4.4 GHz. The performance of the filter depends on geometry and location and types of the MEMS switches. Optimization has been done to achieve tunability by using 3-D high frequency electromagnetic simulator (HFSS).

2021 ◽  
Author(s):  
Lulu Han ◽  
Yu Wang ◽  
Qiannan Wu ◽  
Shiyi Zhang ◽  
Shanshan Wang ◽  
...  

Author(s):  
Suhas S. Mohite ◽  
Mukesh Madhewar ◽  
Vishram B. Sawant

Design objectives in capacitive type radio frequency micro electro mechanical switches (RF-MEMS) are to reduce actuation voltages and to obtain low insertion losses with high isolation. In this study, we report design, modeling and simulation of three new structural configurations using ANSYS to obtain the optimum geometry; further high frequency simulations are performed using HFSS to obtain low insertion losses and high isolation. The designed switches require only 3.9 to 5 V as pull-in voltage for actuation. The mechanical resonant frequency and quality factor are in the range of 6.5 to 8.7 kHz and 1.1 to 1.2, respectively. Switching times for all the designs are 32 to 38 μs at their respective pull-in voltages. Two of the switch designs have insertion loss of less than 0.25 to 0.8 dB at 60 and 50 GHz, and isolation greater than 58 dB for all three designs.


2014 ◽  
Vol 511-512 ◽  
pp. 732-736
Author(s):  
Qin Wen Huang ◽  
Xiang Guang Li ◽  
Yun Hui Wang ◽  
Yu Bin Jia

Based on a one-dimensional model of dielectric charging for capacitive RF MEMS switches, the accumulated charge density and actuation voltage shift were simulated. The results illustrate that rougher surface can reduce dielectric charging, so the dielectric layer should be fabricated much rougher during deposition process. But the capacitance ratio of switch will be decreased with rougher surface, which can cause a reduction of switch performance. Thus the dielectric surface roughness should be balanced in reliability and isolation.


2008 ◽  
Vol 5 (13) ◽  
pp. 483-489 ◽  
Author(s):  
Jong-Man Kim ◽  
Sanghyo Lee ◽  
Chang-Wook Baek ◽  
Youngwoo Kwon ◽  
Yong-Kweon Kim

2017 ◽  
Vol 64 (8) ◽  
pp. 3377-3383 ◽  
Author(s):  
Naibo Zhang ◽  
Lirong Mei ◽  
Chunting Wang ◽  
Zhongliang Deng ◽  
Jun Yang ◽  
...  

2005 ◽  
Author(s):  
Afshin Ziaei ◽  
Thierry Dean ◽  
Jean-Philippe Polizzi

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