Review of Electrical Characterization of Ceramic Thin Films for the Next Generation Semiconductor Devices

Next Generation ◽

Ceramic Thin Films

Vapor Deposition Polymerization and Electrical Characterization of TPD Thin Films

IEICE Transactions on Electronics ◽

10.1587/transele.e94.c.157 ◽

2011 ◽

Vol E94-C (2) ◽

pp. 157-163 ◽

Cited By ~ 4

Author(s):

Masakazu MUROYAMA ◽

Ayako TAJIRI ◽

Kyoko ICHIDA ◽

Seiji YOKOKURA ◽

Kuniaki TANAKA ◽

...

Keyword(s):

Thin Films ◽

Vapor Deposition ◽

Electrical characterization of silicon dioxide and silicon oxynitride thin films

10.31979/etd.dunk-3588 ◽

2006 ◽

Author(s):

April Tai

Keyword(s):

Thin Films ◽

Silicon Dioxide ◽

Silicon Oxynitride

Structure, optical, and electrical characterization of nanostructured gallium sulfide Ga2S3 thin films for electronic and solar cell applications

Journal of Materials Science Materials in Electronics ◽

10.1007/s10854-021-05288-9 ◽

2021 ◽

Author(s):

A. Abdel Moez

Keyword(s):

Thin Films ◽

Solar Cell ◽

Gallium Sulfide

2010 7th International Conference on Electrical Engineering Computing Science and Automatic Control ◽

Electrical characterization of Pd-PdO nanocomposites and PdO thin films prepared by thermal oxidation of Pd

10.1109/iceee.2010.5608620 ◽

2010 ◽

Author(s):

O. Garcia-Serrano ◽

R. Pena-Sierra ◽

G. Romero-Paredes

Keyword(s):

Thin Films ◽

Thermal Oxidation ◽

ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics ◽

Electrical characterization of MOCVD grown epitaxial and polycrystalline PLT thin films

10.1109/isaf.1996.602762 ◽

2002 ◽

Author(s):

A. Kushwaha ◽

R.A. Gerhardt ◽

Y. Kim ◽

A. Erbril

Keyword(s):

Thin Films ◽

Electrical Characterization of Thin Films Using Measurements of Electrical Resistivity

Electronics, Robotics and Automotive Mechanics Conference (CERMA'06) ◽

10.1109/cerma.2006.41 ◽

2006 ◽

Author(s):

J. Vanegasa A. ◽

O. Molina G.

Keyword(s):

Thin Films ◽

Electrical Resistivity ◽

Low Temperature Formation of SiO2 Thin Films by Nitric Acid Oxidation of Si and Electrical Characterization of the Film

Hyomen Kagaku ◽

10.1380/jsssj.29.498 ◽

2008 ◽

Vol 29 (8) ◽

pp. 498-502 ◽

Cited By ~ 1

Author(s):

Taketoshi MATSUMOTO ◽

Kentaro IMAMURA ◽

Hikaru KOBAYASHI

Keyword(s):

Thin Films ◽

Nitric Acid ◽

Low Temperature ◽

Acid Oxidation ◽

Nitric Acid Oxidation

Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC) ◽

Optical and electrical characterization of chemically deposited cadmium sulfide thin films

10.1109/wcpec.1994.519874 ◽

2002 ◽

Cited By ~ 3

Author(s):

M.E. Ozsan ◽

D.R. Johnson ◽

M. Sadeghi ◽

D. Sivapathasundaram ◽

L.M. Peter ◽

...

Keyword(s):

Thin Films ◽

Cadmium Sulfide ◽

Structural and electrical characterization of AIN thin films obtained by nitridation of Al/Si substrate

Journal of Electronic Materials ◽

10.1007/s11664-999-0018-x ◽

1999 ◽

Vol 28 (3) ◽

pp. 225-227 ◽

Cited By ~ 7

Author(s):

Jipo Huang ◽

Lianwei Wang ◽

Qinwo Shen ◽

Chenglu Lin ◽

Mikael Östling

Keyword(s):

Thin Films ◽

Si Substrate

Structural, morphological and electrical characterization of ceria-based nanostructured thin films obtained by ultrasonic spray pyrolysis

Boletín de la Sociedad Española de Cerámica y Vidrio ◽

10.1016/j.bsecv.2018.06.004 ◽

2019 ◽

Vol 58 (1) ◽

pp. 38-47 ◽

Cited By ~ 2

Author(s):

Rubén Martínez-Bautista ◽

Suilma M. Fernández-Valverde ◽

Adriana Tejeda-Cruz ◽

José A. Chávez-Carvayar

Keyword(s):

Thin Films ◽

Spray Pyrolysis ◽

Ultrasonic Spray Pyrolysis ◽

Nanostructured Thin Films ◽

Ultrasonic Spray