scholarly journals Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti

Crystals ◽  
2020 ◽  
Vol 10 (8) ◽  
pp. 691
Author(s):  
Bertalan Jóni ◽  
Éva Ódor ◽  
Mia Maric ◽  
Wolfgang Pantleon ◽  
Tamás Ungár
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Subgrain Size ◽  
Pure Titanium ◽  
Evaluation Procedure ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Dislocation Densities ◽  
Diffraction Peaks

A novel X-ray diffraction-based method and computer program X-TEX has been developed to determine the microstructure in individual texture components of polycrystalline, textured materials. Two different approaches are presented. In the first one, based on the texture of the specimen, the X-TEX software provides optimized specimen orientations for X-ray diffraction experiments in which diffraction peaks consist of intensity contributions stemming from grain populations of separate texture components in the specimen. Texture-specific diffraction patterns can be created by putting such peaks together from different measurements into an artificial pattern for each texture component. In the second one, the X-TEX software can determine the intensity contributions of different texture components to diffraction peaks measured in a particular sample orientation. According to this, peaks belonging mainly to one of the present texture components are identified and grouped into the same quasi-phase during the evaluation procedure. The X-TEX method was applied and tested on tensile-deformed, textured, commercially pure titanium samples. The patterns were evaluated by the convolutional multiple whole profile (CMWP) procedure of line profile analysis for dislocation densities, dipole character, slip systems and subgrain size for three different texture components of the Ti specimens. Significant differences were found in the microstructure evolution in the two major and the random texture components. The dislocation densities were discussed by the Taylor model of work hardening.

Dislocation Densities in Dispersion-Strengthened Copper with Aluminum Oxide from X-Ray Line Profile Analysis

2018 ◽  
Vol 941 ◽  
pp. 2024-2029
Author(s):  
Mutsumi Sano ◽  
Sunao Takahashi ◽  
Atsuo Watanabe ◽  
Ayumi Shiro ◽  
Takahisa Shobu ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Aluminum Oxide ◽  
Ambient Temperature ◽  
Line Profile ◽  
Profile Analysis ◽  
Compressive Strain ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Dislocation Densities

Dislocation densities of dispersion-strengthened copper with aluminum oxide, namely GlidCop were evaluated employing the X-ray line profile analysis using the modified Williamson-Hall and modified Warren-Averbach method. X-ray diffraction profiles for GldCop samples with compressive strains applied at ambient temperature were measured with synchrotron radiation. The dislocation densities of GlidCop with compressive strain ranging from 0 – 2.7 % were on the order of 1.5×1014 – 6.6×1014 m-2.

Dislocation densities and crystallite size distributions in nanocrystalline ball-milled fluorides,MF2(M= Ca, Sr, Ba and Cd), determined by X-ray diffraction line-profile analysis

2005 ◽  
Vol 38 (6) ◽  
pp. 912-926 ◽  
Author(s):  
G. Ribárik ◽  
N. Audebrand ◽  
H. Palancher ◽  
T. Ungár ◽  
D. Louër
Keyword(s):  
Crystallite Size ◽  
Line Profile ◽  
Interference Effect ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
Size Distributions ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Dislocation Densities

The dislocation densities and crystallite size distributions in ball-milled fluorides,MF2(M= Ca, Sr, Ba and Cd), of the fluorite structure type have been determined as a function of milling time by X-ray diffraction line-profile analysis. The treatment has been based on the concept of dislocation contrast to explain strain anisotropy by means of the modified Williamson–Hall and Warren–Averbach approaches and a whole-profile fitting method using physically based functions. In most cases, the measured and calculated patterns are in perfect agreement; however, in some specific cases, the first few measured profiles appear to be narrower than the calculated ones. This discrepancy is interpreted as the result of an interference effect similar to that described by Rafaja, Klemm, Schreiber, Knapp & Kužel [J. Appl. Cryst.(2004),37, 613–620]. By taking into account and correcting for this interference effect, the microstructure of ball-milled fluorides is determined in terms of dislocation structure and size distributions of coherent domains. A weak coalescence of the crystallites is observed at longer milling periods. An incubation period in the evolution of microstrains is in correlation with the homologous temperatures of the fluorides.

Dislocation Densities, Slip-System Types and Burgers Vector Populationsinhexagonal and Cubiccrystalsfrom X-Ray Line Profile Analysis

2011 ◽  
Vol 702-703 ◽  
pp. 479-484
Author(s):  
Tamás Ungár
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Polycrystalline Materials ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
Burgers Vector ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Vector Population ◽  
Dislocation Densities

X-ray diffraction line profile analysis can be carried out on the hkl planes corresponding to the same texture component or the same crystallographic orientation fiber. It is shown that in textured polycrystalline materials or in thin films or multilayers X-ray line profiles measured on planes corresponding either to the main or the minor texture components can provide the Burgers vector population and dislocations densities in the different texture components separately. The experimental technique is outlined for textured specimens and the multiple convolutional whole profile method, i.e. the CMWP line profile analysis procedure, is presented for its capacity to determine the substructure pertaining to different texture components in textured samples.

Twinning, Dislocations and Grain Size in NanoSPD Materials Determined by X-Ray Diffraction

2008 ◽  
Vol 584-586 ◽  
pp. 571-578 ◽  
Author(s):  
Tamás Ungár ◽  
L. Balogh ◽  
Gábor Ribárik
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Systematic Analysis ◽  
Planar Defects ◽  
X Ray ◽  
Dislocation Densities ◽  
And Shifts

High resolution X-ray line profile analysis is sensitive to crystallite size, dislocation densities and character, and to planar defects, especially stacking faults or twinning. The different effects of microstructure features can be evaluated separately on the basis of the different corresponding profile functions and the different hkl dependences of line broadening. Profiles of faulted crystals consist of sub-profiles broadened and shifted according to different hkl conditions. The systematic analysis of the breadts and shifts of sub-profiles enables X-ray line profile analysis by using defect related profile functions corresponding to: (i) size, (ii) strain and (iii) planar faults, respectively. It is shown that twinning can either be enhanced or weakened by severe plastic deformation.

Defect Structures in Neutron Irradiated 6H-SiC Studied by X-Ray Diffraction Line Profile Analysis

2000 ◽  
Vol 640 ◽  
Author(s):  
C. Seitz ◽  
A. Magerl ◽  
R. Hock ◽  
H. Heissenstein ◽  
R. Helbig
Keyword(s):  
Line Profile ◽  
Correlation Length ◽  
Defect Structure ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
Defect Structures ◽  
X Ray Diffraction ◽  
X Ray ◽  
Annealing Temperatures ◽  
Diffraction Line Profile

ABSTRACTWe have investigated by x-ray diffraction defect structures in 6H-SiC after neutron irradiation with different fluences and followed by different annealing procedures. An interpretation along a model of Klimanek [1, 4–6] shows, that higher fluences lead to a stronger than linear reduction of the correlation length, whereas higher annealing temperatures correlate with a better recovery of the correlation length. In addition defects of 1st kind created by irradiation are reduced by annealing. We find that annealing changes the character of the defects and it accentuates a defect structure already present in the original samples.

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