Neutron Diffraction and Diffraction Contrast Imaging for Mapping the TRIP Effect under Load Path Change

The transformation induced plasticity (TRIP) effect is investigated during a load path change using a cruciform sample. The transformation properties are followed by in-situ neutron diffraction derived from the central area of the cruciform sample. Additionally, the spatial distribution of the TRIP effect triggered by stress concentrations is visualized using neutron Bragg edge imaging including, e.g., weak positions of the cruciform geometry. The results demonstrate that neutron diffraction contrast imaging offers the possibility to capture the TRIP effect in objects with complex geometries under complex stress states.

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Microstructure evolution of stainless steel subjected to biaxial load path changes: In-situ neutron diffraction and multi-scale modeling

International Journal of Plasticity ◽

10.1016/j.ijplas.2019.06.006 ◽

2019 ◽

Vol 122 ◽

pp. 49-72 ◽

Cited By ~ 3

Author(s):

Manas V. Upadhyay ◽

Jan Capek ◽

Tobias Panzner ◽

Helena Van Swygenhoven

Keyword(s):

Stainless Steel ◽

Neutron Diffraction ◽

Microstructure Evolution ◽

Load Path ◽

Multi Scale ◽

Scale Modeling ◽

Biaxial Load ◽

Multi Scale Modeling ◽

In Situ Neutron Diffraction

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Strain analysis with nanometer resolution using a conventional transmission electron microsopy technique: electron diffraction contrast imaging revisited

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100137215 ◽

1995 ◽

Vol 53 ◽

pp. 168-169

Author(s):

Koenraad G F Janssens ◽

Omer Van der Biest ◽

Jan Vanhellemont ◽

Herman E Maes ◽

Robert Hull

Keyword(s):

Electron Diffraction ◽

Strain Field ◽

Elastic Strain ◽

Strain Analysis ◽

Local Strain ◽

Contrast Imaging ◽

Strain Characterization ◽

Physical Mechanisms ◽

Diffraction Contrast ◽

Transmission Electron

There is a growing need for elastic strain characterization techniques with submicrometer resolution in several engineering technologies. In advanced material science and engineering the quantitative knowledge of elastic strain, e.g. at small particles or fibers in reinforced composite materials, can lead to a better understanding of the underlying physical mechanisms and thus to an optimization of material production processes. In advanced semiconductor processing and technology, the current size of micro-electronic devices requires an increasing effort in the analysis and characterization of localized strain. More than 30 years have passed since electron diffraction contrast imaging (EDCI) was used for the first time to analyse the local strain field in and around small coherent precipitates1. In later stages the same technique was used to identify straight dislocations by simulating the EDCI contrast resulting from the strain field of a dislocation and comparing it with experimental observations. Since then the technique was developed further by a small number of researchers, most of whom programmed their own dedicated algorithms to solve the problem of EDCI image simulation for the particular problem they were studying at the time.

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