scholarly journals Advanced Electron Microscopy of Nanophased Synthetic Polymers and Soft Complexes for Energy and Medicine Applications

Nanomaterials ◽  
2021 ◽  
Vol 11 (9) ◽  
pp. 2405
Author(s):  
Jihua Chen

After decades of developments, electron microscopy has become a powerful and irreplaceable tool in understanding the ionic, electrical, mechanical, chemical, and other functional performances of next-generation polymers and soft complexes. The recent progress in electron microscopy of nanostructured polymers and soft assemblies is important for applications in many different fields, including, but not limited to, mesoporous and nanoporous materials, absorbents, membranes, solid electrolytes, battery electrodes, ion- and electron-transporting materials, organic semiconductors, soft robotics, optoelectronic devices, biomass, soft magnetic materials, and pharmaceutical drug design. For synthetic polymers and soft complexes, there are four main characteristics that differentiate them from their inorganic or biomacromolecular counterparts in electron microscopy studies: (1) lower contrast, (2) abundance of light elements, (3) polydispersity or nanomorphological variations, and (4) large changes induced by electron beams. Since 2011, the Center for Nanophase Materials Sciences (CNMS) at Oak Ridge National Laboratory has been working with numerous facility users on nanostructured polymer composites, block copolymers, polymer brushes, conjugated molecules, organic–inorganic hybrid nanomaterials, organic–inorganic interfaces, organic crystals, and other soft complexes. This review crystalizes some of the essential challenges, successes, failures, and techniques during the process in the past ten years. It also presents some outlooks and future expectations on the basis of these works at the intersection of electron microscopy, soft matter, and artificial intelligence. Machine learning is expected to automate and facilitate image processing and information extraction of polymer and soft hybrid nanostructures in aspects such as dose-controlled imaging and structure analysis.


Author(s):  
N. D. Evans ◽  
M. K. Kundmann

Post-column energy-filtered transmission electron microscopy (EFTEM) is inherently challenging as it requires the researcher to setup, align, and control both the microscope and the energy-filter. The software behind an EFTEM system is therefore critical to efficient, day-to-day application of this technique. This is particularly the case in a multiple-user environment such as at the Shared Research Equipment (SHaRE) User Facility at Oak Ridge National Laboratory. Here, visiting researchers, who may oe unfamiliar with the details of EFTEM, need to accomplish as much as possible in a relatively short period of time.We describe here our work in extending the base software of a commercially available EFTEM system in order to automate and streamline particular EFTEM tasks. The EFTEM system used is a Philips CM30 fitted with a Gatan Imaging Filter (GIF). The base software supplied with this system consists primarily of two Macintosh programs and a collection of add-ons (plug-ins) which provide instrument control, imaging, and data analysis facilities needed to perform EFTEM.



2005 ◽  
Vol 11 (5) ◽  
pp. 377-377
Author(s):  
Wayne King

The Ninth Frontiers of Electron Microscopy in Materials Science Conference (FEMMS 2003) was held October 5–10, 2003 at the Claremont Resort and Spa in Berkeley, CA. Major sponsors for this meeting included Lawrence Livermore National Laboratory, Argonne National Laboratory, Lawrence Berkeley National Laboratory, Brookhaven National Laboratory, Frederick Seitz Materials Research Laboratory, Oak Ridge National Laboratory, National Science Foundation, and University of California at Davis. Sponsors also included LEO Electron Microscopy Ltd. (Carl Zeiss SMT), E. A. Fischione, Inc., Gatan, Inc., Thermo NORAN (Thermo Electron Corp.), FEI Company, Hitachi-HHTA, JEOL USA, Inc., Seiko Instruments, and CEOS GmbH.



Author(s):  
N. D. Evans

Rapid solidification of hypereutectic niobium-germanium alloys by splatting has been performed to compare the solidification paths of alloys having various amounts of overheat prior to rapid solidification processing (RSP). There is interest in this system because the superconducting A15 phase can achieve high critical magnetic fields and critical current densities. The processing technique, which has been described elsewhere, incorporated an electromagnetic levitation furnace to melt 500 mg masses of alloy in a containerless manner, and a pair of polished copper plates that acted as a double-hammer assembly.Scanning electron microscopy (SEM) was performed with either a Hitachi X-650 Scanning Electron Microanalyzer with a PGT System 4 X-Ray Analyzer energy dispersive spectroscopy (EDS) package, or a Hitachi S-800 High Resolution SEM. A Philips EM400T/FEG with an EDAX 9100/70 EDS system was used to perform analytical electron microscopy (AEM) at the Oak Ridge National Laboratory.





1981 ◽  
Author(s):  
D.A. Webster ◽  
J.S. Beatty ◽  
Pamela K. Benjamin ◽  
W.M. Tranum




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