Faculty Opinions recommendation of Direct imaging of human SWI/SNF-remodeled mono- and polynucleosomes by atomic force microscopy employing carbon nanotube tips.

We report a simple, low cost, reliable technique of making carbon nanotube (CNT) modified atomic force microscopy (AFM) tip. We used the dielectrophoresis and the electrophoresis to align and deposit carbon nanotubes on the end of the AFM tip. From the simulation and the various experiments, we obtained the optimal electric condition, 0.32Vpp/μm. Also, we found that the blunt shape of the tip’s apex is more effective than sharpened one. Through the experiments, we verified that the blunt shape is more effective over 50% than the sharpened one in the attachment of CNTs. By comparing the scanning results between the CNT modified tip and a normal AFM tip, we obtained the improvement in efficiency of 23%.

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Direct imaging of current paths in multiwalled carbon nanofiber polymer nanocomposites using conducting-tip atomic force microscopy

Journal of Applied Physics ◽

10.1063/1.3000458 ◽

2008 ◽

Vol 104 (8) ◽

pp. 083708 ◽

Cited By ~ 30

Author(s):

A. Trionfi ◽

D. A. Scrymgeour ◽

J. W. P. Hsu ◽

M. J. Arlen ◽

D. Tomlin ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Polymer Nanocomposites ◽

Carbon Nanofiber ◽

Direct Imaging ◽

Multiwalled Carbon ◽

Force Microscopy ◽

Atomic Force

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Direct Imaging of Polyethylene Films at Single-Chain Resolution with Torsional Tapping Atomic Force Microscopy

Physical Review Letters ◽

10.1103/physrevlett.107.197801 ◽

2011 ◽

Vol 107 (19) ◽

Cited By ~ 49

Author(s):

Nic Mullin ◽

Jamie K. Hobbs

Keyword(s):

Atomic Force Microscopy ◽

Single Chain ◽

Direct Imaging ◽

Force Microscopy ◽

Polyethylene Films ◽

Atomic Force

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Frequency Response of Carbon Nanotube Probes during Tapping Mode of Atomic Force Microscopy

Applied Mechanics and Materials ◽

10.4028/www.scientific.net/amm.378.466 ◽

2013 ◽

Vol 378 ◽

pp. 466-471

Author(s):

Po Jen Shih ◽

Shang Hao Cai

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Atomic Force Microscope ◽

Frequency Response ◽

Tapping Mode ◽

Force Microscopy ◽

Frequency Responses ◽

Atomic Force ◽

Frequency Drop ◽

Atomic Force Microscope Measurement

The dynamic behaviors of carbon nanotube probes applied in Atomic Force Microscope measurement are of interest in advanced nanoscalar topography. In this paper, we developed the characteristic equations and applied the model analysis to solve the eigenvalues of the microcantilever and the carbon nanotube. The eigenvalues were then used in the tapping mode system to predict the frequency responses against the tip-sample separations. It was found that the frequency drop steeply if the separation was less than certain distances. This instability of frequency is deduced from the jump of microcantilever or the jump of the carbon nanotube. Various lengths and binding angles of the carbon nanotube were considered, and the results indicated that the binding angle dominated the frequency responses and jumps.

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