scholarly journals Everything You Always Wanted to Know About Embedded Trace

2021 ◽  
Author(s):  
Thomas Preußer ◽  
Smitha Gautham ◽  
Abhi Rajagopala ◽  
Carl Elks ◽  
Alexander Weiss
Keyword(s):  
Embedded Systems ◽  
Computer Architecture ◽  
System Integration ◽  
Project Managers ◽  
Embedded Computing ◽  
Computing Systems ◽  
Operational System ◽  
Testing And Debugging ◽  
Software Instrumentation ◽  
Software Intensive

Decades of advances in computer architecture, software-intensive applications and system integration have created significant challenges for embedded systems designers and test engineers. Intrusive software instrumentation and breakpoint-based debugging are often viewed as the primary options for observing operational system internals. This narrow sight creates complicated test flows and convoluted debugging procedures. Modern embedded computing systems offer Embedded Trace as the technological answer to the encountered observability conundrum. Although an integral part of virtually all modern processors, it is frequently overlooked. Its technical foundations are little known to application engineers, test engineers, and project managers. This article explains Embedded Trace as an essential technology in the testing and debugging toolbox. It highlights its capabilities, limitations and opportunities.

scholarly journals Everything You Always Wanted to Know About Embedded Trace

2021 ◽  
Author(s):  
Thomas Preußer ◽  
Smitha Gautham ◽  
Abhi Rajagopala ◽  
Carl Elks ◽  
Alexander Weiss
Keyword(s):  
Embedded Systems ◽  
Computer Architecture ◽  
System Integration ◽  
Project Managers ◽  
Embedded Computing ◽  
Computing Systems ◽  
Operational System ◽  
Testing And Debugging ◽  
Software Instrumentation ◽  
Software Intensive

Decades of advances in computer architecture, software-intensive applications and system integration have created significant challenges for embedded systems designers and test engineers. Intrusive software instrumentation and breakpoint-based debugging are often viewed as the primary options for observing operational system internals. This narrow sight creates complicated test flows and convoluted debugging procedures. Modern embedded computing systems offer Embedded Trace as the technological answer to the encountered observability conundrum. Although an integral part of virtually all modern processors, it is frequently overlooked. Its technical foundations are little known to application engineers, test engineers, and project managers. This article explains Embedded Trace as an essential technology in the testing and debugging toolbox. It highlights its capabilities, limitations and opportunities.

scholarly journals Microprocessors KOMDIV for High Performance Embedded Systems

2021 ◽  
Vol 7 (3) ◽  
Author(s):  
S.G. Bobkov
Keyword(s):  
Embedded Systems ◽  
Power Consumption ◽  
High Performance ◽  
Clock Cycle ◽  
Embedded Computing ◽  
Computing Systems ◽  
Processor Performance

The problems of creating of high-performance embedded computing systems based on microprocessors KOMDIV is considered. Processor performance is dependent upon three characteristics: clock cycle, clock cycles per instruction, and instruction count. These characteristics for microprocessors KOMDIV are optimized using parameter performance/power consumption and requirements of embedded systems.

Formal Reliability Analysis of Embedded Computing Systems

2013 ◽  
pp. 50-64
Author(s):  
Osman Hasan ◽  
Sofiène Tahar
Keyword(s):  
Embedded Systems ◽  
Reliability Analysis ◽  
Nuclear Power ◽  
Power Plants ◽  
Reliability Assessment ◽  
Theorem Prover ◽  
Embedded Computing ◽  
Formal Approach ◽  
Computing Systems ◽  
Reconfigurable Memory

The accurate reliability assessment of embedded systems has become a concern of overwhelming importance with their increasingly ubiquitous usage in safety-critical domains like transportation, medicine, and nuclear power plants. Traditional reliability analysis approaches of testing and simulation cannot guarantee accurate result and thus there is a growing trend towards developing precise mathematical models of embedded systems and to use formal verification methods to assess their reliability. This chapter is mainly focused towards this emerging trend as it presents a formal approach for the reliability assessment of embedded computing systems using a higher-order-logic theorem prover (HOL). Besides providing the formal probability theory based fundamentals of this recently proposed technique, the chapter outlines a generic reliability analysis methodology for embedded systems as well. For illustration purposes, two case studies have been considered, i.e., analyzing the reparability conditions for a reconfigurable memory array in the presence of stuck-at and coupling faults and assessing the reliability of combinational logic based digital circuits.

Securing Embedded Computing Systems through Elliptic Curve Cryptography

2013 ◽  
pp. 402-419 ◽  
Author(s):  
Elisavet Konstantinou ◽  
Panayotis E. Nastou ◽  
Yannis C. Stamatiou ◽  
Christos Zaroliagis
Keyword(s):  
Embedded Systems ◽  
Elliptic Curve ◽  
Elliptic Curve Cryptography ◽  
Security Protocols ◽  
Limited Resources ◽  
Security Level ◽  
Security Technology ◽  
Embedded Computing ◽  
Computing Systems ◽  
Secure Network

Embedded computing devices dominate our everyday activities, from cell phones to wireless sensors that collect and process data for various applications. Although desktop and high-end server security seems to be under control by the use of current security technology, securing the low-end embedded computing systems is a difficult long-term problem. This is mainly due to the fact that the embedded systems are constrained by their operational environment and the limited resources they are equipped with. Recent research activities focus on the deployment of lightweight cryptographic algorithms and security protocols that are well suited to the limited resources of low-end embedded systems. Elliptic Curve Cryptography (ECC) offers an interesting alternative to the classical public key cryptography for embedded systems (e.g., RSA and ElGamal), since it uses smaller key sizes for achieving the same security level, thus making ECC an attractive and efficient alternative for deployment in embedded systems. In this chapter, the processing requirements and architectures for secure network access, communication functions, storage, and high availability of embedded devices are discussed. In addition, ECC-based state-of-the-art lightweight cryptographic primitives for the deployment of security protocols in embedded systems that fulfill the requirements are presented.

Genetic Algorithms

2014 ◽  
pp. 239-255 ◽  
Author(s):  
Pabitra Mohan Khilar
Keyword(s):  
Genetic Algorithms ◽  
Fault Diagnosis ◽  
Distributed Computing ◽  
Embedded Systems ◽  
Distributed Embedded Systems ◽  
Distributed Computing Systems ◽  
Computing Systems ◽  
Satellite Systems ◽  
Complete Problems ◽  
Diagnosis Algorithm

Genetic Algorithms are important techniques to solve many NP-Complete problems related to distributed computing and its application domains. Genetic algorithm-based fault diagnoses in distributed computing systems have been a feasible methodology to solve diagnosis problems recently. Distributed embedded systems consisting of sensors, actuators, processors/microcontrollers, and interconnection networks are one class of distributed computing systems that have long been used, staring from small-scale home appliances to large-scale satellite systems. Some of their applications are in safety-critical systems where occurrence of faults can result in catastrophic situations for which fault diagnosis in such systems are very important. In this chapter, different types of faults, which are likely to occur in distributed embedded systems and a GA-based methodology to solve these problems along with the performance analysis of fault diagnosis algorithm have been presented. Nevertheless, the diagnosis algorithm presented here is well suitable for general purpose distributed computing systems with appropriate modification over system and fault model. In fact, this book chapter will enable the reader not only to study various aspects of fault diagnosis techniques but will also provide insight to build robust systems to allow for continued normal service despite the occurrence of failures.

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