Stress damage process of silicon wafer under millisecond laser irradiation

2018 ◽  
Vol 16 (1) ◽  
pp. 011404 ◽  
Author(s):  
Zhichao Jia Zhichao Jia ◽  
Tingzhong Zhang Tingzhong Zhang ◽  
Huazhong Zhu Huazhong Zhu ◽  
Zewen Li Zewen Li ◽  
Zhonghua Shen Zhonghua Shen ◽  
...  
Keyword(s):  
Laser Irradiation ◽  
Silicon Wafer ◽  
Damage Process ◽  
Stress Damage ◽  
Millisecond Laser

Millisecond laser-induced damage process of (001) silicon wafer

2021 ◽  
Vol 60 (09) ◽  
Author(s):  
Zhichao Jia ◽  
Wei Wang ◽  
Xinhua Li ◽  
Lingyun Hao
Keyword(s):  
Silicon Wafer ◽  
Damage Process ◽  
Laser Induced Damage ◽  
Millisecond Laser

Research on Real-Time Stress Damage of Millisecond Laser Irradiation on Single-Crystal Silicon

2016 ◽  
Vol 36 (2) ◽  
pp. 0219002
Author(s):  
李贺 Li He ◽  
蔡继兴 Cai Jixing ◽  
谭勇 Tan Yong ◽  
马遥 Ma Yao ◽  
郭明 Guo Ming ◽  
...  
Keyword(s):  
Single Crystal ◽  
Real Time ◽  
Laser Irradiation ◽  
Single Crystal Silicon ◽  
Crystal Silicon ◽  
Time Stress ◽  
Stress Damage ◽  
Millisecond Laser

Surface damage morphology investigations of silicon under millisecond laser irradiation

2010 ◽  
Vol 257 (5) ◽  
pp. 1583-1588 ◽  
Author(s):  
X. Wang ◽  
D.H. Zhu ◽  
Z.H. Shen ◽  
J. Lu ◽  
X.W. Ni
Keyword(s):  
Laser Irradiation ◽  
Surface Damage ◽  
Damage Morphology ◽  
Millisecond Laser

Thermal-stress damage of MCT infrared focal plane array detector caused by laser irradiation

2018 ◽  
Vol 39 (5) ◽  
pp. 140-144
Author(s):  
Xia Runqiu ◽  
Liu Yang ◽  
Zhang Yue ◽  
Niu Chunhui ◽  
Lyu Yong
Keyword(s):  
Thermal Stress ◽  
Laser Irradiation ◽  
Focal Plane ◽  
Focal Plane Array ◽  
Array Detector ◽  
Infrared Focal Plane Array ◽  
Stress Damage
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