scholarly journals An Extrapolation Method Of The Steel Temperature Rise For Engineering Fire Resistance Design

2000 ◽  
Vol 6 ◽  
pp. 867-878
Author(s):  
T. Ishihara ◽  
Takao Wakamatsu ◽  
Kazunori Harada ◽  
S. Yusa
Author(s):  
Paweł Roszkowski ◽  
Paweł Sulik

<p>Sandwich panel is the material that is easy and quickly to install. Basing on a great experience in the area of determination of the fire resistance class of construction building elements the authors describe the properties and behavior of building elements made of the sandwich panels exposed to fire. The article presents the results of fire resistance tests carried out in accordance with EN 1364-1 non-bearing walls made of sandwich panels with use of different cores.</p>The following parameters were analyzed: temperature rise on unexposed side (I – thermal insulation), integrity (E) depending on the orientations and on the width of the sandwich panels, deflection depending on the thickness of the boards. Conclusions were made on the base of the analysis from fire resistance tests.


2016 ◽  
Vol 249 ◽  
pp. 33-40
Author(s):  
Vladimír Junek ◽  
Tomáš Micka ◽  
Jiří Kolísko ◽  
Martin Kroc ◽  
Isabela Bradáčová

The subject of the article is to inform the experts about results of a set of fire resistance tests of light concretes designed for traffic and tunnel structures. In addition to commonly used recipe C 30/37 FX4, corresponding version of light concrete class LC 35/38/XF 4 was tested. One of the goals of the tests was verification of behaviour of “road” (XF4) concretes under the most demanding conditions of fire, especially in road tunnels. In addition to standard curve, the hydrocarbon and Eureka curves were used for the fire tests. The loading curves differ from normally used standard curve especially in the temperature rise speed (temperatures over 1,000°C are reached within a couple of minutes). In this case, real concrete moisture and possibility to remove water steams from a component are substantially important for the fire safety (integrity).


Author(s):  
Jun-ichi SUZUKI ◽  
Takahiro ISHIHARA ◽  
Makoto SHIMAMURA ◽  
Yoshifumi OHMIYA ◽  
Shuitsu YUSA ◽  
...  

Author(s):  
Zenji Horita ◽  
Ryuzo Nishimachi ◽  
Takeshi Sano ◽  
Minoru Nemoto

Absorption correction is often required in quantitative x-ray microanalysis of thin specimens using the analytical electron microscope. For such correction, it is convenient to use the extrapolation method[l] because the thickness, density and mass absorption coefficient are not necessary in the method. The characteristic x-ray intensities measured for the analysis are only requirement for the absorption correction. However, to achieve extrapolation, it is imperative to obtain data points more than two at different thicknesses in the identical composition. Thus, the method encounters difficulty in analyzing a region equivalent to beam size or the specimen with uniform thickness. The purpose of this study is to modify the method so that extrapolation becomes feasible in such limited conditions. Applicability of the new form is examined by using a standard sample and then it is applied to quantification of phases in a Ni-Al-W ternary alloy.The earlier equation for the extrapolation method was formulated based on the facts that the magnitude of x-ray absorption increases with increasing thickness and that the intensity of a characteristic x-ray exhibiting negligible absorption in the specimen is used as a measure of thickness.


Author(s):  
M. Watanabe ◽  
Z. Horita ◽  
M. Nemoto

X-ray absorption in quantitative x-ray microanalysis of thin specimens may be corrected without knowledge of thickness when the extrapolation method or the differential x-ray absorption (DXA) method is used. However, there is an experimental limitation involved in each method. In this study, a method is proposed to overcome such a limitation. The method is developed by introducing the ζ factor and by combining the extrapolation method and DXA method. The method using the ζ factor, which is called the ζ-DXA method in this study, is applied to diffusion-couple experiments in the Ni-Al system.For a thin specimen where incident electrons are fully transparent, the characteristic x-ray intensity generated from a beam position, I, may be represented as I = (NρW/A)Qωaist.


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