scholarly journals Onboard scanning system for photodetector with time delay and charge accumulation

2016 ◽  
pp. 49-57
Author(s):  
A. F. Vecherkovskiy ◽  
P. E. Egorov ◽  
A. B. Miloradov ◽  
A. B. Filatov
Keyword(s):  
Time Delay ◽  
High Accuracy ◽  
Scanning System ◽  
Charge Accumulation ◽  
Magnetic Reversal ◽  
Angle Sensor ◽  
Object Space ◽  
Scanning Mirror ◽  
Flat Mirror ◽  
Opposite Motion

The study describes scanning space-based assets which, by means of a flat scanning mirror and an optical system, provides the transformation of the object space into a temporal sequence of electronic signals of a photodetector with a time delay and charge accumulation. High accuracy of photodetector elements polling and scanning of the object space is due to the movement of the scanning mirror according to the indications of a non-contact interferometric angle sensor. The reciprocating rotary scanning by a flat mirror is kinetically compensated by the opposite motion of the flywheel, which minimizes residual perturbations on the space platform. To reduce the impulse energy consumption and the time of reversal between the scanning mirror and the compensating flywheel, magnetic reversal energy recuperators are used.

scholarly journals High Accuracy Profile Measurement With a New Virtual Multi-Probe Scanning System

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 158727-158734
Author(s):  
Ning Chai ◽  
Ziqiang Yin ◽  
Jianhua Yao
Keyword(s):  
High Accuracy ◽  
Scanning System ◽  
Profile Measurement ◽  
Accuracy Profile

Compact Size Multi-Channel True Time Delay Moudle with High Accuracy

2018 ◽  
Author(s):  
Lizhena Zhang ◽  
Zhenhai Li ◽  
Kai Chen ◽  
Guilian Chen ◽  
Yong Zhao
Keyword(s):  
Time Delay ◽  
High Accuracy ◽  
True Time Delay ◽  
Compact Size ◽  
True Time

Development and calibration of an integrated 3D scanning system for high-accuracy large-scale metrology

Measurement ◽  
2014 ◽  
Vol 54 ◽  
pp. 65-76 ◽  
Author(s):  
Shibin Yin ◽  
Yongjie Ren ◽  
Yin Guo ◽  
Jigui Zhu ◽  
Shourui Yang ◽  
...  
Keyword(s):  
Large Scale ◽  
3D Scanning ◽  
High Accuracy ◽  
Scanning System

High Accuracy Time Delay Measurements for Band-Pass Signals

2013 ◽  
Vol 62 (11) ◽  
pp. 2998-3005 ◽  
Author(s):  
Yong Huang ◽  
Jingli Lin ◽  
Mohaned Giess
Keyword(s):  
Time Delay ◽  
High Accuracy ◽  
Band Pass

scholarly journals Tensor-Based Framework With Model Order Selection and High Accuracy Factor Decomposition for Time-Delay Estimation in Dynamic Multipath Scenarios

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 174931-174942
Author(s):  
Mateus Da Rosa Zanatta ◽  
Joao Paulo Carvalho Lustosa Da Costa ◽  
Felix Antreich ◽  
Martin Haardt ◽  
Gordon Elger ◽  
...  
Keyword(s):  
Time Delay ◽  
High Accuracy ◽  
Time Delay Estimation ◽  
Delay Estimation ◽  
Order Selection ◽  
Model Order Selection ◽  
Model Order ◽  
Factor Decomposition

Parameter Determination of Multiple Probes Scanning Method for Profile Measurement

2011 ◽  
Vol 314-316 ◽  
pp. 1707-1712
Author(s):  
Xin Chen ◽  
Guo Qing Ding ◽  
Li Hua Lei ◽  
Yuan Li
Keyword(s):  
Least Squares Method ◽  
Uncertainty Estimation ◽  
Parameter Determination ◽  
Scanning System ◽  
Profile Measurement ◽  
Angle Sensor ◽  
Scanning Method ◽  
Displacement Sensors ◽  
Measured Profile

A multiple probes scanning system comprised of two displacement sensors and one angle sensor is studied for ultra-precise profile measurement. The least squares method is applied to reconstruct the measured profile with uncertainty estimation. The parameters that influence the uncertainty associated with the measured profile are investigated. In order to obtain the optimized uncertainty, the determination of the relative parameters has been discussed in two cases. The first one is that how to select suitable sensors when intervals between two displacement sensors are known. The second one is that how to select suitable intervals between two displacement sensors when the specifications of the sensors are known. The processes of the selection in two cases are illustrated respectively according to the actual situations of the measurement.

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