Investigation on the Combined Effect of Lateral Offset and Transverse Profile Shape on Rut Depth Measurement Accuracy

2016 ◽  
Author(s):  
Di Wang ◽  
Augusto Cannone Falchetto ◽  
Matthias Goeke ◽  
Michael Wistuba ◽  
Yichang (James) Tsai
Keyword(s):  
Measurement Accuracy ◽  
Combined Effect ◽  
Depth Measurement ◽  
Profile Shape ◽  
Transverse Profile ◽  
Lateral Offset

scholarly journals A Sensing Peak Identification Method for Fiber Extrinsic Fabry–Perot Interferometric Refractive Index Sensing

Sensors ◽  
2018 ◽  
Vol 19 (1) ◽  
pp. 96 ◽  
Author(s):  
Bowen Yang ◽  
Biyao Yang ◽  
Ji Zhang ◽  
Yiheng Yin ◽  
Yanxiong Niu ◽  
...  
Keyword(s):  
Refractive Index ◽  
Measurement Accuracy ◽  
Measurement Range ◽  
Superior Performance ◽  
Refractive Index Sensing ◽  
Identification Method ◽  
Peak Identification ◽  
Fabry Perot ◽  
High Measurement ◽  
Lateral Offset

A novel sensing peak identification method for high accuracy refractive index (RI) sensing is proposed. The implementation takes the intensity of interference maximum as the characteristic to distinguish interference peaks, tracking the sensing peak continually during a RI changes, with high measurement accuracy and simple computation. To verify the effect of the method, the extrinsic Fabry–Perot interferometer (EFPI) sensor has been fabricated using the large lateral offset splicing technique. In the RI range from 1.346 to 1.388, the measurement range of the EFPI with the proposed method reaches at least 6 times larger than that of EFPI with the wavelength tracking method and the largest measurement error is −4.47 × 10−4. The EFPI refractive index (RI) sensor identified the sensing peak is believed to play an important role in RI, concentration and density sensing, etc., for superior performance.

Experimental Evaluation of Novel Hybrid Microwave/Ultrasonic Technique to Locate and Characterize Pipe Wall Thinning

2017 ◽  
Vol 140 (1) ◽  
Author(s):  
Wissam M. Alobaidi ◽  
Clifford E. Kintner ◽  
Entidhar A. Alkuam ◽  
Kota Sasaki ◽  
Noritaka Yusa ◽  
...  
Keyword(s):  
Pipe Wall ◽  
Short Circuit ◽  
Depth Measurement ◽  
Profile Shape ◽  
Wall Thinning ◽  
Straight Beam ◽  
Inner Diameter ◽  
Location Depth ◽  
Aluminum Pipe ◽  
Do So

Research using microwaves (MWs) to detect pipe wall thinning (PWT) distinguishes the presence of wall thinning, but does not accurately locate the discontinuities. Ultrasonic testing (UT) is capable of accurately locating the PWT defect, but cannot do so without time-consuming linear scanning. This novel work combines the MW technique as a way to predict the location of a series of PWT specimens, and the UT technique as a way to characterize the PWT specimens in terms of location, depth, and profile shape. The UT probe is guided to the predicted location derived from the Phase One MW results, generating the Phase Two results to determine accurate location, depth measurement, and profile shape detection. The work uses the previously successful experimental setup for testing of an aluminum pipe with 154.051 mm inner diameter (ID) and 1 m length. A vector network analyzer (VNA) generates a MW sweeping frequency range of 1.4–2.3 GHz. This signal is propagated within reference pipes with both open end and short-circuit configurations for calibration of the system. The calibrated system is used to detect the presence and location of six PWT specimens, with two profile shapes, at three depths of thinning and three locations along the pipe. The predicted locations from Phase One are then used to guide a calibrated, manually guided straight beam UT probe to the predicted position. From that point, the UT probe is used in order to accurately localize and determine the depth and shape profile of the specimens.

scholarly journals Depth Measurement Based on Infrared Coded Structured Light

2014 ◽  
Vol 2014 ◽  
pp. 1-8 ◽  
Author(s):  
Tong Jia ◽  
ZhongXuan Zhou ◽  
HaiHong Gao
Keyword(s):  
Linear Relationship ◽  
Measurement Accuracy ◽  
Step Length ◽  
Depth Information ◽  
Grid Pattern ◽  
Depth Measurement ◽  
Object Based ◽  
Fitting Algorithm ◽  
Object Depth ◽  
System Errors

Depth measurement is a challenging problem in computer vision research. In this study, we first design a new grid pattern and develop a sequence coding and decoding algorithm to process the pattern. Second, we propose a linear fitting algorithm to derive the linear relationship between the object depth and pixel shift. Third, we obtain depth information on an object based on this linear relationship. Moreover, 3D reconstruction is implemented based on Delaunay triangulation algorithm. Finally, we utilize the regularity of the error curves to correct the system errors and improve the measurement accuracy. The experimental results show that the accuracy of depth measurement is related to the step length of moving object.

238: Combined Effect of Apoptotic Biomarkers on Bladder Cancer Recurrence and Mortality after Radical Cystectomy

2007 ◽  
Vol 177 (4S) ◽  
pp. 79-80
Author(s):  
Jose A. Karam ◽  
Yair Lotan ◽  
Raheela Ashfaq ◽  
Claus G. Roehrborn ◽  
Arthur I. Sagalowsky ◽  
...  
Keyword(s):  
Bladder Cancer ◽  
Radical Cystectomy ◽  
Cancer Recurrence ◽  
Combined Effect ◽  
Bladder Cancer Recurrence

Methods for Restricting Maximum Exposure Rate in Computerized Adaptative Testing

Methodology ◽  
2007 ◽  
Vol 3 (1) ◽  
pp. 14-23 ◽  
Author(s):  
Juan Ramon Barrada ◽  
Julio Olea ◽  
Vicente Ponsoda
Keyword(s):  
Measurement Accuracy ◽  
Computerized Adaptive Testing ◽  
Computation Time ◽  
Adaptive Testing ◽  
Exposure Rate ◽  
Control Parameters ◽  
The Impact ◽  
Two Alternatives ◽  
Selection Of ◽  
Maximum Exposure

Abstract. The Sympson-Hetter (1985) method provides a means of controlling maximum exposure rate of items in Computerized Adaptive Testing. Through a series of simulations, control parameters are set that mark the probability of administration of an item on being selected. This method presents two main problems: it requires a long computation time for calculating the parameters and the maximum exposure rate is slightly above the fixed limit. Van der Linden (2003) presented two alternatives which appear to solve both of the problems. The impact of these methods in the measurement accuracy has not been tested yet. We show how these methods over-restrict the exposure of some highly discriminating items and, thus, the accuracy is decreased. It also shown that, when the desired maximum exposure rate is near the minimum possible value, these methods offer an empirical maximum exposure rate clearly above the goal. A new method, based on the initial estimation of the probability of administration and the probability of selection of the items with the restricted method ( Revuelta & Ponsoda, 1998 ), is presented in this paper. It can be used with the Sympson-Hetter method and with the two van der Linden's methods. This option, when used with Sympson-Hetter, speeds the convergence of the control parameters without decreasing the accuracy.

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