Reliability Analysis on Errors of Measuring Residual Stress in 7050 Aluminum Alloy with X-Ray Diffraction

2011 ◽  
Vol 105-107 ◽  
pp. 1867-1871
Author(s):  
Ai Xin Feng ◽  
Bin Li ◽  
Chuan Chao Xu ◽  
Jun Wei Wang ◽  
Zhen Chun Han ◽  
...  
Keyword(s):  
Residual Stress ◽  
Aluminum Alloy ◽  
Stress Measurement ◽  
Residual Stress Distribution ◽  
Least Square ◽  
Residual Stress Measurement ◽  
Material Surface ◽  
X Ray Diffraction ◽  
X Ray ◽  
7050 Aluminum Alloy

The error distribution of residual stress tested by X-ray diffraction on 7050 aluminum alloy was studied. In this paper, residual stress was measured, independently and repeatedly, many times on 7050 aluminum alloy with X-ray diffraction, then the errors about 50 stress values within the range of 30MPa were analyzed by the hypothesis testing. The results indicate that the errors of the residual stress measurement on 7050 aluminum alloy were followed the law of normal distribution about and the errors can be estimated by the least square calculator. The research lays the foundation to subsequent researches on the inherent law of the residual stress measurement with X-ray diffraction and the residual stress distribution and accuracy of stress of material surface.

The Use of Renka Cline Algorithm in X-Ray Diffraction Residual Stress Measurement

2014 ◽  
Vol 881-883 ◽  
pp. 1846-1850
Author(s):  
Chun Guang Li ◽  
Zhong Chen Dai ◽  
Zhong Huang Yun ◽  
Dong Feng Li ◽  
Xing Hua Cao
Keyword(s):  
Residual Stress ◽  
Aluminum Alloy ◽  
Welded Joints ◽  
Reliable Method ◽  
Stress Measurement ◽  
Residual Stress Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Longitudinal Residual Stress

Using the Renka Cline algorithm provided by OriginPro8.6 to fit the longitudinal residual stress through parts of the measurement value on the A7N01-T5 aluminum alloy butt welded joints compared with the whole measurement value. The result shows that the fitting value approximates the measurement value. The fitting value is reliable. So, Renka Cline algorithm is a reliable method to analyze the longitudinal residual stress on a plate region.

Measurement of Residual Stress Distribution of Ground Silicon Nitride by Glancing Incidence X-ray Diffraction Technique

1995 ◽  
Vol 39 ◽  
pp. 331-338
Author(s):  
Yoshihisa Sakaida ◽  
Keisuke Tanaka ◽  
Shintaro Harada
Keyword(s):  
Residual Stress ◽  
Surface Layer ◽  
Stress Distribution ◽  
Stress Measurement ◽  
Scintillation Counter ◽  
Ground Surface ◽  
Residual Stress Distribution ◽  
X Ray Diffraction ◽  
X Ray ◽  
Very High

A new method of X-ray stress measurement was proposed to estimate non-destructively the steep residual stress distribution in the surface layer of ground Si3N4. We assumed an exponential decrement of the residual stress near the ground surface, and derived a formula for the lattice strain as a function of sin2Ψ. In the experiments, the diffraction angles were measured on the ground surface for a widest possible range of sin2ѱ using an Ω-goniometer. In order to measure the diffraction angle at very high sin η values, a scintillation counter was located on the -η side and an incident X-ray beam impinged on the ground surface with a very low angle from the +η side using the glancing incidence X-ray diffraction technique. A strong non-linearity was found in the 20-sin2ѱ diagrams especially at very high ѱ -angles. From the analysis of non-linearity, the stress distribution in the surface layer was determined. Tine residual stress took the maximum compression of 2 GPa at a depth of about 0.5 μm from the surface, and then diminished to zero at about 25 μm in depth. In the close vicinity of the ground surface, the compressive residual stress was relieved because of both the surface roughness and microcracking induced during the grinding process.

X-Ray Diffraction Measurement of Residual Stresses in Thick, Multi-Pass Steel Weldments

1985 ◽  
Vol 107 (2) ◽  
pp. 185-191 ◽  
Author(s):  
C. O. Ruud ◽  
R. N. Pangborn ◽  
P. S. DiMascio ◽  
D. J. Snoha
Keyword(s):  
Residual Stress ◽  
Measurement Accuracy ◽  
Stress Measurement ◽  
Three Dimensional ◽  
Residual Stress Measurement ◽  
Stress Fields ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Removal Technique

A unique X-ray diffraction instrument for residual stress measurement has been developed that provides for speed, ease of measurement, accuracy, and economy of surface stress measurement. Application of this instrument with a material removal technique, e.g., electropolishing, has facilitated detailed, high resolution studies of three-dimensional stress fields. This paper describes the instrumentation and techniques applied to conduct the residual stress measurement and presents maps of the residual stress data obtained for the surfaces of a heavy 2 1/4 Cr 1 Mo steel plate weldment.

1011 Residual Stress Measurement of Butt Weld of Thick Plates Using X-ray Diffraction Technique

2009 ◽  
Vol 2009.46 (0) ◽  
pp. 385-386
Author(s):  
Koji Hattori ◽  
Mitsuyoshi Nakatani ◽  
Tomoki Takehashi ◽  
Masamitsu Abe ◽  
Toshihiko Sasaki
Keyword(s):  
Residual Stress ◽  
Stress Measurement ◽  
Residual Stress Measurement ◽  
X Ray Diffraction ◽  
Butt Weld ◽  
Thick Plates ◽  
X Ray

X-Ray Diffraction Analysis Analyze the Error of Residual Stress by Using Mathematical Statistics

2010 ◽  
Vol 43 ◽  
pp. 687-690
Author(s):  
Ai Xin Feng ◽  
Chuan Chao Xu ◽  
Yu Peng Cao ◽  
Huai Yang Sun ◽  
Gui Fen Ni ◽  
...  
Keyword(s):  
Residual Stress ◽  
Aluminum Alloy ◽  
Statistical Analysis ◽  
Diffraction Analysis ◽  
Hypothesis Testing ◽  
Normal Distribution ◽  
X Ray Diffraction ◽  
X Ray ◽  
7050 Aluminum Alloy ◽  
Stress Error

X-ray diffraction analysis methods analyze the residual stress the same location for 50 times of 7050 aluminum alloy. And taking residual stress error for statistical analysis, through hypothesis testing and analysis of the residual stress error Square diagram, obtain X-ray diffraction the residual stress error of the 7050 aluminum alloy approximately obey normal distribution.

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