Research on Fault Diagnosis Methods for Mixed-Signal Circuits

2013 ◽  
Vol 313-314 ◽  
pp. 1239-1242
Author(s):  
Xun Zhou ◽  
Xiao Li Wang

In terms of the developing actuality of mixed-signal circuits, several familiar diagnosis methods are introduced in the paper including the basis principle, the merits and demerits for each method. At the same time, the design for testability based on Boundary scan is discussed. At last, the developing trends of this field is predicted.

2013 ◽  
Vol 427-429 ◽  
pp. 636-639
Author(s):  
Guo Gang Liao ◽  
Jun Li

Nowadays with the increases of the density of large scale integrated circuits, researches of Design for Test (DFT) become more and more important, JTAG (JTAG: Joint Test Action Group, also called Boundary Scan ) has been widely used in test area , which improves the testability and reliability of mixed-signal circuits. This paper puts forward a scheme to design a Built-in Test System (BITS) based on boundary scan technology. The BITS is realized in a weapon electronic control system, which is composed of mixed-signal circuits including ARM, AD/DA, FPGA, etc. With this method, several test experiments are carried out in the BITS, which include infrastructure integrity test, interconnect test, cluster test, AD/DA test and so on. The results of experiments show that the Built-in Test System based on JTAG can work normally, which is able to reduce effectively the complexity and the time of test. In a word, the capability of BITS is viable and the system is a virtual tool in the process of DFT design and application.


Author(s):  
David Walter ◽  
Scott Little ◽  
Chris Myers ◽  
Nicholas Seegmiller ◽  
Tomohiro Yoneda

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