Atomic Force Microscope Manifestation of Heat-Resistant Polymer Thermal Stability

2014 ◽  
Vol 1073-1076 ◽  
pp. 2267-2271
Author(s):  
Tao Ping Chen ◽  
Biao Qiu ◽  
Na Wang ◽  
Ru He

Aimed at BH heat-resistant polymer, 4500mg/L solution is compounded by oilfield sewage, and then diluted into 1500mg/L solution by oilfield sewage again under room temperature, aging in the constant temperature box of 95°C finally. Test slides are made of different aging time BH heat-resistance polymer solution, whose thermal stability is manifested by atomic force microscope. Results show the aggregation degree of BH heat-resistant polymer solution are different after aging for 30d, 60d, 90d under 95°C. They gather largely before aging, are into a loose branch distribution. After aging for 30d, their aggregation degree declines, branch length becomes shorter. After aging for 60d, their aggregation status change greatly, are into "╫╫" shape comb distribution. After aging for 90d, they gather into about 10μm in diameter short fat wafer, and are not easy to expand.

2019 ◽  
Vol 70 (3) ◽  
pp. 174-176
Author(s):  
Yuichi TAKASAKA ◽  
Ryo FUJII ◽  
Naoki YAMADA ◽  
Naoki FUKUMURO ◽  
Susumu SAKAMOTO ◽  
...  

2009 ◽  
Vol 59 (5) ◽  
pp. 254-260
Author(s):  
Takahiko Nakamura ◽  
Kenji Muramatsu ◽  
Masanori Nagai ◽  
Ryouhei Otsu ◽  
Shin-ya Komatsu

1995 ◽  
Vol 10 (9) ◽  
pp. 2159-2161 ◽  
Author(s):  
J.H. Schneibel ◽  
L. Martínez

Fe–40 at. % Al–0.1 at. % B specimens were polished flat, strained at room temperature, and examined in an atomic force microscope. The angles of height contours perpendicular to the slip lines were interpreted as shear strains and were statistically evaluated. The frequency distributions of these shear strains correlated well with the macroscopic strains. The maximum shear strains found were not much larger than the macroscopic strains. In particular, no steep slip steps corresponding to large local shears were found.


2013 ◽  
Vol 785-786 ◽  
pp. 918-923 ◽  
Author(s):  
Lin Huang ◽  
Xue Nian Lin ◽  
Ren Wu Chen ◽  
Jiang Yong Wang

The Sn whisker growth in Cu(top)-Sn(bottom) bilayer system upon room temperature aging was investigated by scanning electron microscope and X-ray diffraction techniques. The experimental observations indicate that the Sn whisker growth on the Cu surface in Cu-Sn bilayer system is different from that on the Sn surface in Sn-Cu bilayer system. When the Sn sublayer thickness is less than 0.5μm, the Sn whisker growth can take place in Cu-Sn system but not in Sn-Cu system. An explanation for Sn whisker growth in Cu-Sn bilayer system is given.


2015 ◽  
Vol 515 ◽  
pp. 54-61 ◽  
Author(s):  
А.V. Fetisov ◽  
G.А. Kozhina ◽  
S.Kh. Estemirova ◽  
V.Ya. Mitrofanov

1997 ◽  
Vol 23 (7) ◽  
pp. 546-547 ◽  
Author(s):  
V. D. Blank ◽  
M. Yu. Popov ◽  
N. A. L’vova ◽  
K. V. Gogolinskii ◽  
V. N. Reshetov

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