Analysis and Improvement in Color-Based Target Recognition Algorithm of Robot

2013 ◽  
Vol 655-657 ◽  
pp. 1043-1047 ◽  
Author(s):  
Dong Bo Zhou ◽  
Ji Cai Deng ◽  
Geng Hui Wang ◽  
Qi Xin Deng
Keyword(s):  
Control System ◽  
Real Time ◽  
Humanoid Robot ◽  
Target Recognition ◽  
Robot Vision ◽  
Recognition Algorithm ◽  
Color Information ◽  
Real Time Control ◽  
Table Lookup ◽  
Time Control

In the Martial Arts arena contest of robot, Humanoid robot should recognize the target timely and accurately. So robot vision technology becomes a key of the contest. In this paper, target recognition algorithms based on color information are analyzed. According to the results, an improved algorithm based on Table Lookup method is proposed, which aimed to provide more rapidity of computing in real-time control system on the robot. It is shown in illustrative experiment that average 50% time was saved in computing when using the new algorithm instead of traditional algorithms.

A New Flexible Rapid Thermal Processing System

1995 ◽  
Vol 389 ◽  
Author(s):  
K. C. Saraswat ◽  
Y. Chen ◽  
L. Degertekin ◽  
B. T. Khuri-Yakub
Keyword(s):  
Control System ◽  
Real Time ◽  
Processing System ◽  
Process Conditions ◽  
Temperature Uniformity ◽  
Real Time Control ◽  
Wafer Temperature ◽  
Time Control ◽  
Wide Range ◽  
Optical Flux

ABSTRACTA highly flexible Rapid Thermal Multiprocessing (RTM) reactor is described. This flexibility is the result of several new innovations: a lamp system, an acoustic thermometer and a real-time control system. The new lamp has been optimally designed through the use of a “virtual reactor” methodology to obtain the best possible wafer temperature uniformity. It consists of multiple concentric rings composed of light bulbs with horizontal filaments. Each ring is independently and dynamically controlled providing better control over the spatial and temporal optical flux profile resulting in excellent temperature uniformity over a wide range of process conditions. An acoustic thermometer non-invasively allows complete wafer temperature tomography under all process conditions - a critically important measurement never obtained before. For real-time equipment and process control a model based multivariable control system has been developed. Extensive integration of computers and related technology for specification, communication, execution, monitoring, control, and diagnosis demonstrates the programmability of the RTM.

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