Non-Destructive Testing of Polycrystalline Silicon Solar Panel by Scan Acoustic Microscopy

2013 ◽  
Vol 764 ◽  
pp. 9-13 ◽  
Author(s):  
Zhen Ying Xu ◽  
Shu Yuan Gao ◽  
Jun Huang ◽  
Yun Wang

The inner structure and defects of the silicon panel will influence the transfer efficiency and the stability of the polycrystalline solar cells, thus the non-destructive testing of the silicon panel is very important. In this paper, a Scan Acoustic Microscopy is applied to test the inner structure of polycrystalline silicon solar panel. From the grey image of C-Scan by the microscopy, the amplitude distribution of the bottom wave generated by the interaction between the inner grains of the polycrystalline silicon and the acoustic beam can be seen clearly. Furthermore, the defects as well as their size and position can also be tested by A-Scan, B-Scan and C-Scan with high resolution and high accuracy. The experiment results show that it is a good non-destructive method to test and evaluate the quality of the inner structure of polycrystalline silicon solar panel.

2016 ◽  
Vol 61 (2) ◽  
pp. 1009-1019 ◽  
Author(s):  
M. Korzeniowski ◽  
B. Białobrzeska

AbstractThe article presents the possibilities of using acoustic microscopy to evaluate defects in resistance spot welding joints. For this purpose, the welded joints were made from two grades of aluminium plates EN AW5754 H24 and EN AW6005 T606, which were then subjected to non-destructive testing using acoustic microscopy and conventional destructive testing using traditional light microscopy techniques. Additionally, the study examined the influence of the typical contaminants found in industrial conditions on the quality of the joint.


2020 ◽  
Vol 14 (11) ◽  
pp. 19
Author(s):  
Gaston Sanglier ◽  
Jose Miguel ◽  
Jose Antonio Penaranda ◽  
y Gabriel Del Ojo

Non-Destructive Testing (NDT) has gone from being a simple laboratory curiosity to an indispensable tool in the industry to determine the level of quality achieved in its products. The new concepts of Integrated Manufacturing (CIM) bring a more universal concept of quality compared to the past philosophy based on Quality Control as a group specialized in checking whether production works within certain specifications. Even so, NDTs have not lost interest, but have seen their interest increased due to automated inspection techniques. It has become a contribution to the structuring of quality as it allows to move from purely empirical criteria to other more objective and that constitute the link between design and evaluation (Ramirez et al, 1996). The work presented, although it does not propose new methods or techniques of NDT, has the interest of converging into a single object five conventional methods each of which provides partial information about their quality of manufacture and must synthesize the results in order to evaluate it. Furthermore, it shows a situation of the application of NDT in which these must be applied in the absence of reference standards, as they do not exist. This peculiar situation is completely different from the usual situation in the use of NDT in the industry, both in manufacturing processes and in maintenance inspections.


2020 ◽  
Vol 14 (3) ◽  
pp. 369-374
Author(s):  
Željko Bilić ◽  
Ivan Samardžić ◽  
Nedjeljko Mišina ◽  
Katarina Stoić

As already known, no proper control or process control parameter which absolutely guarantees a high level quality of joints made by electro-resistive welding has been established so far, especially when all possible parameters are taken into account during the welding process. Due to the process of butt-welding being very short-lived, ensuring quality of the joints is a difficult and under-researched problem. The application of non-destructive testing methods to the control interface joints is also not reliable. Therefore, further research in this area should concentrate on studying the influence of basic welding parameters, and calculating their direct or indirect impact can serve to achieve a highquality welded joint with for practice sufficient accuracy.


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