Excess Heat Triggering by 488 nm Laser in a D/Pd Gas-Loading System

2013 ◽  
Vol 834-836 ◽  
pp. 1182-1185 ◽  
Author(s):  
Xing Ye Wang ◽  
Bing Jun Shen ◽  
Li Hong Jin ◽  
Xin Le Zhao ◽  
Jian Tian

A beam of Argon ion laser (λ = 488 nm and P = 40 mW) was used to irradiate some palladium deuterides with different deuteron loading ratios in a D/Pd gas-loading system (19 different loading ratios ranging from 0 to 0.77). The results showed that there was a maximum excess heat of about 287 J within an hour in the system when the loading ratio was about 0.65. This corresponds to 2.6×103 eV/atom D or 1.7 ×103eV/atom Pd. The results indicate that the proper ratio in the Pd lattice matching a suitable triggering power may be the key factor to excess heat production.

Author(s):  
H.S. Mavi ◽  
S. Rath ◽  
Arun Shukla

Laser-induced etching of silicon is used to generate silicon nanocrystals. The pore structure depends on the substrate type and etching laser wavelength. Porous silicon (PS) samples prepared by Nd:YAG laser (1.16 eV) etching of n-type substrate showed a fairly uniform and highly interconnected network of nearly circular pores separated by thin columnar boundaries, while no circular pits were produced by argon- ion laser (2.41 eV) etching under similar conditions. The size and size distribution of the nanocrystals are investigated by Raman and photoluminescence spectroscopies and analyzed within the framework of quantum confinement models.


1972 ◽  
Vol 5 (10) ◽  
pp. 1807-1814 ◽  
Author(s):  
A Maitland ◽  
J C L Cornish
Keyword(s):  

1988 ◽  
Vol 8 (4) ◽  
pp. 3-9
Author(s):  
Norio MIYOSHI ◽  
Takahiro SEKI ◽  
Shuichi KINOSHITA ◽  
Takashi KUSHIDA ◽  
Tsuyoshi NISHIZAKA ◽  
...  

1982 ◽  
Vol 3 (1) ◽  
pp. 35-38
Author(s):  
Masatoshi Esaki ◽  
Hideo Hiratsuka ◽  
Mamoru Hiyama ◽  
Osamu Ueda ◽  
Yukio Toda ◽  
...  

1977 ◽  
Vol 13 (10) ◽  
pp. 808-809 ◽  
Author(s):  
M. Birnbaum ◽  
A. Tucker ◽  
C. Fincher

1993 ◽  
Vol 47 (11) ◽  
pp. 1767-1771 ◽  
Author(s):  
Ching-Hui Tseng ◽  
Charles K. Mann ◽  
Thomas J. Vickers

Detection limits of about 1 g/m2 are demonstrated for the Raman determination of two organic materials, polydimethylsiloxane and dimethyl methylphosphonate, on an aluminum surface. A fiber-optic-based system is used. A large sample area is scanned to overcome heterogeneity in sample coverage. Measurements are made without use of an internal standard. Results are reported for both a Hadamard transform technique with argon-ion laser excitation and a conventional spectrometer with diode laser excitation.


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