Preparation and Electrical Properties of (100) Preferred (Ba,Sr)TiO3 Bilayer Thin Films Derived from Pulse Laser Deposition Method

2007 ◽  
Vol 280-283 ◽  
pp. 849-852
Author(s):  
Sheng Guo Lu ◽  
Philip A. Friddle ◽  
Z.K. Xu ◽  
G.G. Siu ◽  
Haydn Chen ◽  
...  

Bilayer Ba0.6Sr0.4TiO3 - Ba0.4Sr0.6TiO3 and Ba0.4Sr0.6TiO3 - Ba0.6Sr0.4TiO3 thin films were deposited on the LaNiO3-buffered Pt/Ti/SiO2/Si substrates using pulse laser deposition method. A (100)preferred orientation was obtained. The structure was characterized using x-ray diffraction (XRD) and Raman spectroscopy. The leakage current, and dielectric permittivity versus temperature were characterized. Results indicated that the (100) preferred bilayer structure had less leakage current and smaller loss tangent, which was in favor of enhancing the quality of thin film used as microwave dielectrics.

2003 ◽  
Vol 784 ◽  
Author(s):  
A. Dixit ◽  
P. Bhattacharaya ◽  
S. B. Majumder ◽  
R. S. Katiyar ◽  
A. S. Bhalla

ABSTRACTFerroelectric thin films of BaZrxTi1-xO3 (BZT) were deposited on platinum (Pt) and platinized silicon (Pt/Si) substrates by sol-gel and pulse laser deposition technique respectively. The structure and preferred orientation of the films were examined by x-ray diffraction measurements. The phase formation of sol-gel derived BZT films were found to be at high temperature (1100°C) compare to the pulse laser deposited BZT films ∼ 700°C. Polycrystalline films were observed by both techniques. Ferroelectric nature of the films was confirmed by hysteresis and capacitance-voltage characteristics using platinum top electrodes. Dielectric constant as well as loss was found to decrease by increasing Zr contents. Surface morphology predicted smooth crack free surface.


2013 ◽  
Vol 100 ◽  
pp. 7-10 ◽  
Author(s):  
Xiaosong Lv ◽  
Chuanpin Cheng ◽  
Yongguang Xiao ◽  
Minghua Tang ◽  
Zhenhua Tang ◽  
...  

2013 ◽  
Vol 702 ◽  
pp. 154-158
Author(s):  
Xin Hao ◽  
Yuan Fu Chen ◽  
Ze Gao Wang ◽  
Cheng Zou ◽  
Yan Rong Li

Pb(Zr0.52Ti0.48)O3/La0.8Ca0.2MnO3 (PZT/LCMO) thin films were deposited onto SrTiO3 (STO) single crystalline substrates by pulse laser deposition (PLD). The AFM morphology results show that the LCMO ( PZT) layer is very smooth and homogenous with very low values of RMS roughness. The XRD results show that only the (00l) peaks are observed for both LCMO and PZT layers which are single crystalline and have an epitaxial relationship with STO substrates: PZT (001)//LCMO(001)//STO (001). The FWHM values of the (001) omega-rocking curves of the LCMO and PZT film were 0.276o and 0.565o, respectively, which suggests high crystalline quality of epitaxial PZT/LSMO LSMO heterostructures were grown on STO substrates.


1999 ◽  
Vol 69 (7) ◽  
pp. S347-S353 ◽  
Author(s):  
P.S. Banks ◽  
L. Dinh ◽  
B.C. Stuart ◽  
M.D. Feit ◽  
A.M. Komashko ◽  
...  

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