Atomic Force Microscopy Study of Grain Evolution during Growth of Thin Oxide Films

1996 ◽  
Vol 204-206 ◽  
pp. 729-734
Author(s):  
Frank Czerwinski ◽  
Jerzy A. Szpunar
Keyword(s):  
Atomic Force Microscopy ◽  
Oxide Films ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force ◽  
Thin Oxide Films ◽  
Thin Oxide

Atomic Force Microscopy Study of Nickel Oxide Films Modified by Reactive Element

1994 ◽  
Vol 343 ◽  
Author(s):  
F. Czerwinski ◽  
J.A. Szpunar
Keyword(s):  
Atomic Force Microscopy ◽  
Substrate Surface ◽  
Oxide Films ◽  
Microscopy Study ◽  
Reactive Element ◽  
Pure Oxygen ◽  
Polycrystalline Nickel ◽  
Force Microscopy ◽  
Atomic Force ◽  
Thin Oxide Films

ABSTRACTThe evolution of microstructure of thin oxide films during growth has been quantitatively analysed by atomic force microscopy (AFM). The oxide films were formed in pure oxygen atmosphere at temperatures ranging from 873 to 1173 K on polycrystalline nickel substrates. The substrates were both pure and superficially modified by nanometer-sized dispersions of CeO2. The incorporation of reactive element into the oxide inhibits the growth kinetics and affects the microscopic surface morphology. The extent of this effect depends essentially on the substrate surface microstructure prior to modification and the size of CeO2 particles. A correlation was found between the surface topography and the reduction of oxide growth rate caused by the reactive element.

Adsorption of Polyethylenimine on Graphite:  An Atomic Force Microscopy Study

2003 ◽  
Vol 36 (25) ◽  
pp. 9510-9518 ◽  
Author(s):  
Marc Schneider ◽  
Martin Brinkmann ◽  
Helmuth Möhwald
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force
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