An atomic force microscopy study of thin copper oxide films grown by molecular beam epitaxy on MgO(100)

Thin Solid Films ◽

10.1016/0040-6090(96)08574-4 ◽

1996 ◽

Vol 281-282 ◽

pp. 57-59 ◽

Author(s):

A. Brazdeikis ◽

U.O. Karlsson ◽

A.S. Flodström

Keyword(s):

Atomic Force Microscopy ◽

Molecular Beam Epitaxy ◽

Copper Oxide ◽

Molecular Beam ◽

Oxide Films ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

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Atomic force microscopy study of sapphire surfaces annealed with a H[sub 2]O flux from a baffled molecular-beam epitaxy effusion cell loaded with Al(OH)[sub 3]

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ◽

10.1116/1.2200384 ◽

2006 ◽

Vol 24 (3) ◽

pp. 1572 ◽

Author(s):

Michael M. Oye ◽

Jeffrey B. Hurst ◽

Davood Shahrjerdi ◽

N. N. Kulkarni ◽

A. Muller ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Molecular Beam Epitaxy ◽

Molecular Beam ◽

Microscopy Study ◽

Effusion Cell ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

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Atomic Force Microscopy Study of Grain Evolution during Growth of Thin Oxide Films

Materials Science Forum ◽

10.4028/www.scientific.net/msf.204-206.729 ◽

1996 ◽

Vol 204-206 ◽

pp. 729-734

Author(s):

Frank Czerwinski ◽

Jerzy A. Szpunar

Keyword(s):

Atomic Force Microscopy ◽

Oxide Films ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Thin Oxide Films ◽

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Scanning Tunneling Microscopy and Atomic Force Microscopy Study on Interface between Molecular-Beam-Grown Pt Film and Si(111) Substrate

Japanese Journal of Applied Physics ◽

10.1143/jjap.34.3336 ◽

1995 ◽

Vol 34 (Part 1, No. 6B) ◽

pp. 3336-3341 ◽

Author(s):

Kouichi Nishikawa ◽

Masahiko Yamamoto ◽

Katsuyuki Ichimiya ◽

Yukihiro Umetani ◽

Toshiki Kingetsu

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Molecular Beam ◽

Microscopy Study ◽

Scanning Tunneling ◽

Atomic Force Microscopy Study ◽

Tunneling Microscopy ◽

Force Microscopy ◽

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Atomic force microscopy study of the fractal shape of residual barium cuprate/copper oxide flux on the surface of Y2Ba4Cu7O15 and YBa2Cu4O8 single crystals

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.587244 ◽

1994 ◽

Vol 12 (3) ◽

pp. 1614

Author(s):

H. P. Lang

Keyword(s):

Atomic Force Microscopy ◽

Copper Oxide ◽

Single Crystals ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

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Nano-structural signs of the cortical bone fragility: atomic force microscopy study in the femoral neck of elderly hip fracture patients and healthy aged controls

Bone Abstracts ◽

10.1530/boneabs.1.pp48 ◽

2013 ◽

Author(s):

Petar Milovanovic ◽

Zlatko Rakocevic ◽

Jelena Potocnik ◽

Danijela Djonic ◽

Vladimir Zivkovic ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Hip Fracture ◽

Femoral Neck ◽

Cortical Bone ◽

Microscopy Study ◽

Bone Fragility ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

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Atomic Force Microscopy study on the effect of different lecithins in cocoa-butter based suspensions

Colloids and Surfaces A Physicochemical and Engineering Aspects ◽

10.1016/j.colsurfa.2016.03.057 ◽

2016 ◽

Vol 499 ◽

pp. 60-68 ◽

Author(s):

D. Middendorf ◽

U. Bindrich ◽

P. Mischnick ◽

A. Juadjur ◽

K. Franke ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Cocoa Butter ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

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Operando atomic force microscopy study of electric double-layer transistors based on ionic liquid/rubrene single crystal interfaces

Applied Physics Letters ◽

10.1063/5.0053848 ◽

2021 ◽

Vol 118 (24) ◽

pp. 243301

Author(s):

Yusuke Morino ◽

Yasuyuki Yokota ◽

Ken-ichi Bando ◽

Hisaya Hara ◽

Akihito Imanishi ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Single Crystal ◽

Double Layer ◽

Electric Double Layer ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Crystal Interfaces

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Adsorption of Polyethylenimine on Graphite: An Atomic Force Microscopy Study

Macromolecules ◽

10.1021/ma0345293 ◽

2003 ◽

Vol 36 (25) ◽

pp. 9510-9518 ◽

Author(s):

Marc Schneider ◽

Martin Brinkmann ◽

Helmuth Möhwald

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

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Importance of the indentation depth in tapping-mode atomic force microscopy study of compliant materials

Applied Physics Letters ◽

10.1063/1.125581 ◽

1999 ◽

Vol 75 (26) ◽

pp. 4198-4200 ◽

Author(s):

G. Bar ◽

L. Delineau ◽

R. Brandsch ◽

M. Bruch ◽

M.-H. Whangbo

Keyword(s):

Atomic Force Microscopy ◽

Indentation Depth ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Self-lubricant behaviour of copper-carbon nanocomposites: An electron microscopy and atomic force microscopy study

Microscopy and Microanalysis ◽

10.1017/s1431927614014275 ◽

2015 ◽

Vol 21 (S6) ◽

pp. 114-115

Author(s):

D. Silva ◽

J. Jeremias ◽

D. Nunes ◽

J.B. Correia ◽

K. Hanada ◽

...

Keyword(s):

Electron Microscopy ◽

Atomic Force Microscopy ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Carbon Nanocomposites ◽

Force Microscopy ◽

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