Operando atomic force microscopy study of electric double-layer transistors based on ionic liquid/rubrene single crystal interfaces

2021 ◽  
Vol 118 (24) ◽  
pp. 243301
Author(s):  
Yusuke Morino ◽  
Yasuyuki Yokota ◽  
Ken-ichi Bando ◽  
Hisaya Hara ◽  
Akihito Imanishi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Single Crystal ◽  
Double Layer ◽  
Electric Double Layer ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force ◽  
Crystal Interfaces

Molecularly clean ionic liquid/rubrene single-crystal interfaces revealed by frequency modulation atomic force microscopy

2015 ◽  
Vol 17 (10) ◽  
pp. 6794-6800 ◽  
Author(s):  
Yasuyuki Yokota ◽  
Hisaya Hara ◽  
Yusuke Morino ◽  
Ken-ichi Bando ◽  
Akihito Imanishi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Single Crystal ◽  
Frequency Modulation ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Force Microscopy ◽  
Atomic Force ◽  
Clean Interface ◽  
Crystal Interfaces

Frequency modulation atomic force microscopy was employed to show a molecularly clean interface between an ionic liquid and a rubrene single crystal for possible applications to electric double-layer field-effect transistors.

Atomic force microscopy study of Gd(Co,Cu)5 single-crystal surface relief

2011 ◽  
Vol 5 (6) ◽  
pp. 1107-1111 ◽  
Author(s):  
Yu. V. Kuznetsova ◽  
N. P. Suponev ◽  
O. B. Degteva ◽  
P. S. Salev
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Surface Relief ◽  
Crystal Surface ◽  
Microscopy Study ◽  
Single Crystal Surface ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force

Structural investigation of ionic liquid/rubrene single crystal interfaces by using frequency-modulation atomic force microscopy

2013 ◽  
Vol 49 (90) ◽  
pp. 10596 ◽  
Author(s):  
Yasuyuki Yokota ◽  
Hisaya Hara ◽  
Tomohiro Harada ◽  
Akihito Imanishi ◽  
Takafumi Uemura ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Single Crystal ◽  
Frequency Modulation ◽  
Structural Investigation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Crystal Interfaces

The Electric Double Layer in an Ionic Liquid Incorporated with Water Molecules: Atomic Force Microscopy Force Curve Study

2016 ◽  
Vol 3 (12) ◽  
pp. 2221-2226 ◽  
Author(s):  
Yunxin Zhong ◽  
Jiawei Yan ◽  
Miangang Li ◽  
Li Chen ◽  
Bingwei Mao
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Double Layer ◽  
Electric Double Layer ◽  
Water Molecules ◽  
Force Curve ◽  
Force Microscopy ◽  
Atomic Force

Nano-structural signs of the cortical bone fragility: atomic force microscopy study in the femoral neck of elderly hip fracture patients and healthy aged controls

2013 ◽  
Author(s):  
Petar Milovanovic ◽  
Zlatko Rakocevic ◽  
Jelena Potocnik ◽  
Danijela Djonic ◽  
Vladimir Zivkovic ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Hip Fracture ◽  
Femoral Neck ◽  
Cortical Bone ◽  
Microscopy Study ◽  
Bone Fragility ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy study on the effect of different lecithins in cocoa-butter based suspensions

2016 ◽  
Vol 499 ◽  
pp. 60-68 ◽  
Author(s):  
D. Middendorf ◽  
U. Bindrich ◽  
P. Mischnick ◽  
A. Juadjur ◽  
K. Franke ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Cocoa Butter ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force

Adsorption of Polyethylenimine on Graphite:  An Atomic Force Microscopy Study

2003 ◽  
Vol 36 (25) ◽  
pp. 9510-9518 ◽  
Author(s):  
Marc Schneider ◽  
Martin Brinkmann ◽  
Helmuth Möhwald
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force

An atomic force microscopy study of thin copper oxide films grown by molecular beam epitaxy on MgO(100)

1996 ◽  
Vol 281-282 ◽  
pp. 57-59 ◽  
Author(s):  
A. Brazdeikis ◽  
U.O. Karlsson ◽  
A.S. Flodström
Keyword(s):  
Atomic Force Microscopy ◽  
Molecular Beam Epitaxy ◽  
Copper Oxide ◽  
Molecular Beam ◽  
Oxide Films ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force

Importance of the indentation depth in tapping-mode atomic force microscopy study of compliant materials

1999 ◽  
Vol 75 (26) ◽  
pp. 4198-4200 ◽  
Author(s):  
G. Bar ◽  
L. Delineau ◽  
R. Brandsch ◽  
M. Bruch ◽  
M.-H. Whangbo
Keyword(s):  
Atomic Force Microscopy ◽  
Indentation Depth ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy
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