Operando atomic force microscopy study of electric double-layer transistors based on ionic liquid/rubrene single crystal interfaces

2021 ◽  
Vol 118 (24) ◽  
pp. 243301
Author(s):  
Yusuke Morino ◽  
Yasuyuki Yokota ◽  
Ken-ichi Bando ◽  
Hisaya Hara ◽  
Akihito Imanishi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Single Crystal ◽  
Double Layer ◽  
Electric Double Layer ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force ◽  
Crystal Interfaces

Molecularly clean ionic liquid/rubrene single-crystal interfaces revealed by frequency modulation atomic force microscopy

2015 ◽  
Vol 17 (10) ◽  
pp. 6794-6800 ◽  
Author(s):  
Yasuyuki Yokota ◽  
Hisaya Hara ◽  
Yusuke Morino ◽  
Ken-ichi Bando ◽  
Akihito Imanishi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Single Crystal ◽  
Frequency Modulation ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Force Microscopy ◽  
Atomic Force ◽  
Clean Interface ◽  
Crystal Interfaces

Frequency modulation atomic force microscopy was employed to show a molecularly clean interface between an ionic liquid and a rubrene single crystal for possible applications to electric double-layer field-effect transistors.

Structural investigation of ionic liquid/rubrene single crystal interfaces by using frequency-modulation atomic force microscopy

2013 ◽  
Vol 49 (90) ◽  
pp. 10596 ◽  
Author(s):  
Yasuyuki Yokota ◽  
Hisaya Hara ◽  
Tomohiro Harada ◽  
Akihito Imanishi ◽  
Takafumi Uemura ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Single Crystal ◽  
Frequency Modulation ◽  
Structural Investigation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Crystal Interfaces

Adsorption of Polyethylenimine on Graphite:  An Atomic Force Microscopy Study

2003 ◽  
Vol 36 (25) ◽  
pp. 9510-9518 ◽  
Author(s):  
Marc Schneider ◽  
Martin Brinkmann ◽  
Helmuth Möhwald
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force
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