Residual Stress Measurement in Sputtered Copper Thin Films by Synchrotron Radiation and Ordinary X-Rays

Materials Science Forum ◽

10.4028/www.scientific.net/msf.490-491.661 ◽

2005 ◽

Vol 490-491 ◽

pp. 661-666

Author(s):

Mitsuhiko Hataya ◽

Hanabusa Takao ◽

Kazuya Kusaka ◽

Kikuo Tominaga ◽

Tatsuya Matsue ◽

...

Keyword(s):

Residual Stress ◽

Synchrotron Radiation ◽

Stress Measurement ◽

Residual Stress Measurement ◽

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Residual Stress Measurement in Sputtered Copper Thin Films by Synchrotron Radiation and Ordinary X-Rays

Materials Science Forum - Residual Stresses VII, ICRS7 ◽

10.4028/0-87849-969-5.661 ◽

2005 ◽

pp. 661-666

Author(s):

Mitsuhiko Hataya ◽

Takao Hanabusa ◽

Kazuya Kusaka ◽

Kikuo Tominaga ◽

Tatsuya Matsue ◽

...

Keyword(s):

Residual Stress ◽

Synchrotron Radiation ◽

Stress Measurement ◽

Residual Stress Measurement ◽

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Residual Stress Measurement by X-Rays: Errors, Limitations and Applications

Nondestructive Evaluation of Materials ◽

10.1007/978-1-4613-2952-7_5 ◽

1979 ◽

pp. 101-115 ◽

Author(s):

C. O. Ruud ◽

G. D. Farmer

Keyword(s):

Residual Stress ◽

Stress Measurement ◽

Residual Stress Measurement ◽

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Use of Cr K-Beta X-Rays and Position Sensitive Detector for Residual Stress Measurement in Stainless Steel Pipe

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9987-2_26 ◽

1979 ◽

pp. 247-249 ◽

Author(s):

C. O. Ruud ◽

C. S. Barrett

Keyword(s):

Residual Stress ◽

Stainless Steel ◽

Stress Measurement ◽

Residual Stress Measurement ◽

Position Sensitive Detector ◽

X Rays ◽

Sensitive Detector ◽

Stainless Steel Pipe ◽

Position Sensitive

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DIC Image on FIB Ring-Core Analysis of Depth Sensing Residual Stress Measurement of Thin Films

Conference Proceedings of the Society for Experimental Mechanics Series - Advancement of Optical Methods & Digital Image Correlation in Experimental Mechanics, Volume 3 ◽

10.1007/978-3-319-97481-1_15 ◽

2018 ◽

pp. 109-111 ◽

Author(s):

Wen Chieh Pan ◽

Ang-Ting Tsai ◽

Fa-Yen Cheng ◽

Terry Yuan-Fang Chen ◽

Ming-Tzer Lin

Keyword(s):

Residual Stress ◽

Stress Measurement ◽

Residual Stress Measurement ◽

Core Analysis ◽

Depth Sensing ◽

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Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging

Thin Solid Films ◽

10.1016/j.tsf.2011.10.211 ◽

2012 ◽

Vol 520 (6) ◽

pp. 2073-2076 ◽

Author(s):

Xu Song ◽

Kong Boon Yeap ◽

Jing Zhu ◽

Jonathan Belnoue ◽

Marco Sebastiani ◽

...

Keyword(s):

Residual Stress ◽

Focused Ion Beam ◽

Stress Measurement ◽

Ion Beam ◽

Residual Stress Measurement ◽

Focused Ion Beam Milling

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Residual Stress Measurement in YBCO Thin Films

Ceramic Transactions Series - Processing of High Temperature Superconductors ◽

10.1002/9781118405932.ch20 ◽

2012 ◽

pp. 219-228

Author(s):

Jae Hong Cheon ◽

J. P. Singh

Keyword(s):

Residual Stress ◽

Stress Measurement ◽

Residual Stress Measurement ◽

Ybco Thin Films

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Residual stress measurement in thin films using a slitting method with geometric phase analysis under a dual beam (FIB/SEM) system

Measurement Science and Technology ◽

10.1088/0957-0233/25/9/095003 ◽

2014 ◽

Vol 25 (9) ◽

pp. 095003 ◽

Author(s):

Ronghua Zhu ◽

Huimin Xie ◽

Xianglu Dai ◽

Jianguo Zhu ◽

Aizi Jin

Keyword(s):

Residual Stress ◽

Phase Analysis ◽

Geometric Phase ◽

Stress Measurement ◽

Residual Stress Measurement ◽

Slitting Method ◽

Dual Beam ◽

Geometric Phase Analysis

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Mechanism of Residual Stress Introduction by Pulsed-laser (2) : Residual Stress Measurement on and around Laser-irradiated Spot by Synchrotron Radiation

The proceedings of the JSME annual meeting ◽

10.1299/jsmemecjo.2004.1.0_261 ◽

2004 ◽

Vol 2004.1 (0) ◽

pp. 261-262

Author(s):

Hirotomo TANAKA ◽

Koichi AKITA ◽

Shin-ichi OHYA ◽

Yuji SANO ◽

Hideki NAITOU ◽

...

Keyword(s):

Residual Stress ◽

Synchrotron Radiation ◽

Stress Measurement ◽

Pulsed Laser ◽

Residual Stress Measurement

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A Position-Sensitive Proportional Counter for Residual Stress Measurement by Means of Microbeam X-Rays

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-3096-7_42 ◽

1980 ◽

pp. 325-330 ◽

Author(s):

Yasuo Yoshioka ◽

Ken-ichi Hasegawa ◽

Koh-ichi Mochiki

Keyword(s):

Residual Stress ◽

Proportional Counter ◽

Stress Measurement ◽

Residual Stress Measurement ◽

X Rays ◽

Position Sensitive

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Residual stress measurement in thin films using the semi-destructive ring-core drilling method using Focused Ion Beam

Procedia Engineering ◽

10.1016/j.proeng.2011.04.362 ◽

2011 ◽

Vol 10 ◽

pp. 2190-2195 ◽

Author(s):

X. Song ◽

K.B. Yeap ◽

J. Zhu ◽

J. Belnoue ◽

M. Sebastiani ◽

...

Keyword(s):

Residual Stress ◽

Focused Ion Beam ◽

Stress Measurement ◽

Ion Beam ◽

Residual Stress Measurement ◽

Core Drilling ◽

Drilling Method ◽

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