A Position-Sensitive Proportional Counter for Residual Stress Measurement by Means of Microbeam X-Rays

AbstractA position-sensitive proportional counter (PSPC) with high counting efficiency has been made for stress analysis with low intensity X-rays such as microbeam X-rays.This PSPC system has made it possible to measure the residual stress in a small region such as a fatigue crack tip in very short time compared with the measurement by standard diffractometer or film methods.

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Residual Stress Measurement by X-Rays: Errors, Limitations and Applications

Nondestructive Evaluation of Materials ◽

10.1007/978-1-4613-2952-7_5 ◽

1979 ◽

pp. 101-115 ◽

Cited By ~ 4

Author(s):

C. O. Ruud ◽

G. D. Farmer

Keyword(s):

Residual Stress ◽

Stress Measurement ◽

Residual Stress Measurement ◽

X Rays

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The Use of Mn-Kα X-Rays and a New Model of PSPC in Stress Analysis of Stainless Steel

Advances in X-ray Analysis ◽

10.1154/s0376030800012507 ◽

1982 ◽

Vol 26 ◽

pp. 209-216 ◽

Cited By ~ 2

Author(s):

Yasuo Yoshioka ◽

Ken-ichi Hasegawa ◽

Koh-ichi Mochiki

Keyword(s):

Stainless Steel ◽

Stress Analysis ◽

High Precision ◽

Proportional Counter ◽

Stress Measurement ◽

X Rays ◽

New Model ◽

Major Disadvantage ◽

Position Sensitive

The authors previously reported stress measurement in stainless steel by the use of monochromatic Cr-Kβ X-rays and a position sensitive proportional counter. Results indicated that a stress value can be obtained with high precision on account of the subtraction of background and the elimination of αFe(211) peak by Cr-Kα X-rays. The major disadvantage of this method, however, is that the intensity of Kβ X-rays monochromatized is essentially weak and it is complicated to eliminate Kα X-rays for practical use.

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Residual Stress Measurement in Sputtered Copper Thin Films by Synchrotron Radiation and Ordinary X-Rays

Materials Science Forum ◽

10.4028/www.scientific.net/msf.490-491.661 ◽

2005 ◽

Vol 490-491 ◽

pp. 661-666

Author(s):

Mitsuhiko Hataya ◽

Hanabusa Takao ◽

Kazuya Kusaka ◽

Kikuo Tominaga ◽

Tatsuya Matsue ◽

...

Keyword(s):

Thin Films ◽

Residual Stress ◽

Synchrotron Radiation ◽

Stress Measurement ◽

Residual Stress Measurement ◽

X Rays

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Residual Stress Measurement in Sputtered Copper Thin Films by Synchrotron Radiation and Ordinary X-Rays

Materials Science Forum - Residual Stresses VII, ICRS7 ◽

10.4028/0-87849-969-5.661 ◽

2005 ◽

pp. 661-666

Author(s):

Mitsuhiko Hataya ◽

Takao Hanabusa ◽

Kazuya Kusaka ◽

Kikuo Tominaga ◽

Tatsuya Matsue ◽

...

Keyword(s):

Thin Films ◽

Residual Stress ◽

Synchrotron Radiation ◽

Stress Measurement ◽

Residual Stress Measurement ◽

X Rays

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Application of a Position Sensitive Scintillation Detector for Nondestructive Residual Stress Measurements Inside Stainless Steel Piping

Advances in X-ray Analysis ◽

10.1154/s0376030800012532 ◽

1982 ◽

Vol 26 ◽

pp. 233-243 ◽

Cited By ~ 1

Author(s):

C.O. Ruud ◽

P.S. DiMascio ◽

D.M. Melcher

Keyword(s):

Residual Stress ◽

Stainless Steel ◽

Stress Measurement ◽

Residual Stress Measurement ◽

Intergranular Stress Corrosion ◽

Stress Measurements ◽

Absolute Residual ◽

Position Sensitive ◽

Water Reactors ◽

Steel Piping

As early as 1974 cracking was observed in the austenitic stainless steel piping systems of several Boiling Water Reactors [1,2]. Failure analysis indicated that the cracks developed through intergranular stress-corrosion cracking and an active interest in residual stress measurement methodologies developed. This paper describes the procedures and demonstration testing employed to provide absolute residual stress measurement, nondestructively, on the inside surface of pipe specimens. A Ruud-Barrett position sensitive detector (PSSD)* was used to build an EPRI pipe stress analyzer which was developed for these residual stress measurements [3,4].

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Stress Measurement in Stainless Steel by use of Monochromatic Cr-Kβ X-Rays and a Position Sensitive Detector

Advances in X-ray Analysis ◽

10.1154/s037603080000728x ◽

1980 ◽

Vol 24 ◽

pp. 167-172 ◽

Cited By ~ 1

Author(s):

Yasuo Yoshioka ◽

Ken-ichi Hasegawa ◽

Koh-ichi Mochiki

Keyword(s):

Residual Stress ◽

Stainless Steel ◽

Stress Measurement ◽

Diffraction Peak ◽

X Rays ◽

High Contrast ◽

Sensitive Detector ◽

X Ray ◽

Position Sensitive ◽

Martensite Structure

X-ray stress analysis in austenltic stainless steel is generally carried out on the ϒFe(311) diffraction line produced by Cr- Kβ X-rays. However, it is often pointed out that not much reliance can be placed on the precision of the stress because the contrast between a diffraction peak and its background is poor. In addition, to measure the stress is sometimes impossible on a specimen which has martensite structure produced by thes train induced transformation, because the ϒFe(211) line appears in the neighborhood of the desired ϒFe(311) line, since Cr-K6 X-rays accompany Cr-Ka from a conventional X-ray source. If Cr-Ka X-rays can be eliminated and only Cr-KB X-rays directed on the specimen, only the λe(311) line with high contrast will be obtained and one can expect to measure the residual stress with high precision.

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