Residual Stress Measurement in YBCO Thin Films

Ceramic Transactions Series - Processing of High Temperature Superconductors ◽

10.1002/9781118405932.ch20 ◽

2012 ◽

pp. 219-228

Author(s):

Jae Hong Cheon ◽

J. P. Singh

Keyword(s):

Residual Stress ◽

Stress Measurement ◽

Residual Stress Measurement ◽

Ybco Thin Films

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DIC Image on FIB Ring-Core Analysis of Depth Sensing Residual Stress Measurement of Thin Films

Conference Proceedings of the Society for Experimental Mechanics Series - Advancement of Optical Methods & Digital Image Correlation in Experimental Mechanics, Volume 3 ◽

10.1007/978-3-319-97481-1_15 ◽

2018 ◽

pp. 109-111 ◽

Author(s):

Wen Chieh Pan ◽

Ang-Ting Tsai ◽

Fa-Yen Cheng ◽

Terry Yuan-Fang Chen ◽

Ming-Tzer Lin

Keyword(s):

Residual Stress ◽

Stress Measurement ◽

Residual Stress Measurement ◽

Core Analysis ◽

Depth Sensing ◽

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Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging

Thin Solid Films ◽

10.1016/j.tsf.2011.10.211 ◽

2012 ◽

Vol 520 (6) ◽

pp. 2073-2076 ◽

Author(s):

Xu Song ◽

Kong Boon Yeap ◽

Jing Zhu ◽

Jonathan Belnoue ◽

Marco Sebastiani ◽

...

Keyword(s):

Residual Stress ◽

Focused Ion Beam ◽

Stress Measurement ◽

Ion Beam ◽

Residual Stress Measurement ◽

Focused Ion Beam Milling

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Residual stress measurement in thin films using a slitting method with geometric phase analysis under a dual beam (FIB/SEM) system

Measurement Science and Technology ◽

10.1088/0957-0233/25/9/095003 ◽

2014 ◽

Vol 25 (9) ◽

pp. 095003 ◽

Author(s):

Ronghua Zhu ◽

Huimin Xie ◽

Xianglu Dai ◽

Jianguo Zhu ◽

Aizi Jin

Keyword(s):

Residual Stress ◽

Phase Analysis ◽

Geometric Phase ◽

Stress Measurement ◽

Residual Stress Measurement ◽

Slitting Method ◽

Dual Beam ◽

Geometric Phase Analysis

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Residual Stress Measurement in Sputtered Copper Thin Films by Synchrotron Radiation and Ordinary X-Rays

Materials Science Forum ◽

10.4028/www.scientific.net/msf.490-491.661 ◽

2005 ◽

Vol 490-491 ◽

pp. 661-666

Author(s):

Mitsuhiko Hataya ◽

Hanabusa Takao ◽

Kazuya Kusaka ◽

Kikuo Tominaga ◽

Tatsuya Matsue ◽

...

Keyword(s):

Residual Stress ◽

Synchrotron Radiation ◽

Stress Measurement ◽

Residual Stress Measurement ◽

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Residual stress measurement in thin films using the semi-destructive ring-core drilling method using Focused Ion Beam

Procedia Engineering ◽

10.1016/j.proeng.2011.04.362 ◽

2011 ◽

Vol 10 ◽

pp. 2190-2195 ◽

Author(s):

X. Song ◽

K.B. Yeap ◽

J. Zhu ◽

J. Belnoue ◽

M. Sebastiani ◽

...

Keyword(s):

Residual Stress ◽

Focused Ion Beam ◽

Stress Measurement ◽

Ion Beam ◽

Residual Stress Measurement ◽

Core Drilling ◽

Drilling Method ◽

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X-Ray Residual Stress Measurement of Aluminum Thin Films with (111)Fiber Texture.

Journal of the Society of Materials Science Japan ◽

10.2472/jsms.45.1138 ◽

1996 ◽

Vol 45 (10) ◽

pp. 1138-1144

Author(s):

Keisuke TANAKA ◽

Keisaku ISHIHARA ◽

Kaoru INOUE

Keyword(s):

Residual Stress ◽

Stress Measurement ◽

Fiber Texture ◽

Residual Stress Measurement ◽

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Residual Stress Measurement in Sputtered Copper Thin Films by Synchrotron Radiation and Ordinary X-Rays

Materials Science Forum - Residual Stresses VII, ICRS7 ◽

10.4028/0-87849-969-5.661 ◽

2005 ◽

pp. 661-666

Author(s):

Mitsuhiko Hataya ◽

Takao Hanabusa ◽

Kazuya Kusaka ◽

Kikuo Tominaga ◽

Tatsuya Matsue ◽

...

Keyword(s):

Residual Stress ◽

Synchrotron Radiation ◽

Stress Measurement ◽

Residual Stress Measurement ◽

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Comparison of residual stress measurement in thin films using surface micromachining method

Thin Solid Films ◽

10.1016/j.tsf.2007.07.086 ◽

2008 ◽

Vol 516 (16) ◽

pp. 5318-5323 ◽

Author(s):

Q. He ◽

Z.X. Luo ◽

X.Y. Chen

Keyword(s):

Residual Stress ◽

Stress Measurement ◽

Residual Stress Measurement ◽

Surface Micromachining

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The residual stress-induced buckling of annular thin plates and its application in residual stress measurement of thin films

Sensors and Actuators A Physical ◽

10.1016/j.sna.2007.11.028 ◽

2008 ◽

Vol 143 (2) ◽

pp. 409-414 ◽

Author(s):

Da-Yong Qiao ◽

Wei-Zheng Yuan ◽

Yi-Ting Yu ◽

Qing Liang ◽

Zhi-Bo Ma ◽

...

Keyword(s):

Residual Stress ◽

Stress Measurement ◽

Residual Stress Measurement ◽

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X-Ray Residual Stress Measurement in Films with Crystallographic Texture and Grain Shape

MRS Proceedings ◽

10.1557/proc-403-177 ◽

1995 ◽

Vol 403 ◽

Author(s):

L. G. Yu ◽

B. C. Hendrix ◽

K. W. Xu ◽

J. W. He ◽

H. C. Gu

Keyword(s):

Residual Stress ◽

Crystallographic Texture ◽

Grain Shape ◽

Stress Measurement ◽

Residual Stress Measurement ◽

Powerful Method ◽

X Ray Diffraction ◽

X Ray ◽

AbstractX-ray diffraction provides an easy and powerful method for measuring residual stress in thin films. However, nonlinearity of the d vs. sin2ψ relation can lead to the misinterpretation of results, especially when one of the measurements is made at low values of ψ relation for different combinations of ideal crystallographic textures and grain shapes are given. In all cases, a high ψ angle range exists where the d vs. sin2ψ relation in the low ψ angle range.

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