A 3D FIB Investigation of Dynamic Recrystallization in a Cu-Sn Bronze

2012 ◽  
Vol 715-716 ◽  
pp. 498-501 ◽  
Author(s):  
Ali Gholinia ◽  
Ian Brough ◽  
John F. Humphreys ◽  
Pete S. Bate
Keyword(s):  
Dynamic Recrystallization ◽  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Bronze Alloy ◽  
Ebsd Data ◽  
Nucleation Sites ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Relationship Of

A combination of electron backscatter diffraction (EBSD) and focused ion beam (FIB) techniques were used to obtain 3D EBSD data in an investigation of dynamic recrystallization in a Cu-2%Sn bronze alloy. The results of this investigation show the origin of the nucleation sites for dynamic recrystallization and also elucidates the orientation relationship of the recrystallized grains to the deformed, prior grains and between the dynamically recrystallized grains.

Intergrowth Structure of Zeolite Crystals and Pore Orientation of Individual Subunits Revealed by Electron Backscatter Diffraction/Focused Ion Beam Experiments

2008 ◽  
Vol 47 (30) ◽  
pp. 5637-5640 ◽  
Author(s):  
Eli Stavitski ◽  
Martyn R. Drury ◽  
D. A. Matthijs de Winter ◽  
Marianne H. F. Kox ◽  
Bert M. Weckhuysen
Keyword(s):  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Zeolite Crystals

Application of FIB-EBSD Tomography for Understanding Annealing Phenomena in a Cold Rolled Particle-Containing Nickel Alloy

2007 ◽  
Vol 558-559 ◽  
pp. 413-418 ◽  
Author(s):  
Wan Qiang Xu ◽  
Michael Ferry ◽  
Julie M. Cairney ◽  
John F. Humphreys
Keyword(s):  
Nickel Alloy ◽  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Serial Sectioning ◽  
Dual Beam ◽  
Electron Backscatter ◽  
Cold Rolled ◽  
Twin Formation ◽  
Backscatter Diffraction

A typical dual-beam platform combines a focused ion beam (FIB) microscope with a field emission gun scanning electron microscope (FEGSEM). Using FIB-FEGSEM, it is possible to sequentially mill away > ~ 50 nm sections of a material by FIB and characterize, at high resolution, the crystallographic features of each new surface by electron backscatter diffraction (EBSD). The successive images can be combined to generate 3D crystallographic maps of the microstructure. A useful technique is described for FIB milling that allows the reliable reconstruction of 3D microstructures using EBSD. This serial sectioning technique was used to investigate the recrystallization behaviour of a particle-containing nickel alloy, which revealed a number of features of the recrystallizing grains that are not clearly evident in 2D EBSD micrographs such as clear evidence of particle stimulated nucleation (PSN) and twin formation and growth during PSN.

Intergrowth Structure of Zeolite Crystals and Pore Orientation of Individual Subunits Revealed by Electron Backscatter Diffraction/Focused Ion Beam Experiments

2008 ◽  
Vol 120 (30) ◽  
pp. 5719-5722 ◽  
Author(s):  
Eli Stavitski ◽  
Martyn R. Drury ◽  
D. A. Matthijs de Winter ◽  
Marianne H. F. Kox ◽  
Bert M. Weckhuysen
Keyword(s):  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Zeolite Crystals

scholarly journals TEM Sample Preparation and FIB-Induced Damage

MRS Bulletin ◽  
2007 ◽  
Vol 32 (5) ◽  
pp. 400-407 ◽  
Author(s):  
Joachim Mayer ◽  
Lucille A. Giannuzzi ◽  
Takeo Kamino ◽  
Joseph Michael
Keyword(s):  
Electron Microscope ◽  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
X Ray ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Future Potential ◽  
Backscatter Diffraction ◽  
Composite Samples

AbstractOne of the most important applications of a focused ion beam (FIB) workstation is preparing samples for transmission electron microscope (TEM) investigation. Samples must be uniformly thin to enable the analyzing beam of electrons to penetrate. The FIB enables not only the preparation of large, uniformly thick, sitespecific samples, but also the fabrication of lamellae used for TEM samples from composite samples consisting of inorganic and organic materials with very different properties. This article gives an overview of the variety of techniques that have been developed to prepare the final TEM specimen. The strengths of these methods as well as the problems, such as FIB-induced damage and Ga contamination, are illustrated with examples. Most recently, FIB-thinned lamellae were used to improve the spatial resolution of electron backscatter diffraction and energy-dispersive x-ray mapping. Examples are presented to illustrate the capabilities, difficulties, and future potential of FIB.

Electron-Backscatter Diffraction of Photovoltaic Thin Films

2007 ◽  
Vol 1012 ◽  
Author(s):  
Helio Moutinho ◽  
Ramesh Dhere ◽  
Chun-Sheng Jiang ◽  
Bobby To ◽  
Mowafak Al-Jassim
Keyword(s):  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Surface Damage ◽  
Sample Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ebsd Data ◽  
Electron Backscatter ◽  
Backscatter Diffraction

AbstractIn electron-backscatter diffraction, crystalline orientation maps are formed while the electron beam of an SEM scans the sample surface. EBSD requires a flat sample to avoid shadowing of the electrons from the detector by surface features. In this work, we investigate the preparation of CdTe samples deposited by close-spaced sublimation for EBSD analysis. Untreated samples were rough, resulting in areas with no EBSD signal. We processed the samples by polishing and ion-beam milling. Polishing produced flat samples, but low-quality EBDS data, because the top surface of the samples had poor crystallinity. In contrast, ion-beam milling proved to be suitable for producing flat samples with minimal surface damage, yielding good EBSD data. We also analyzed the samples with atomic force microscopy, and correlated the quality of the EBSD data with sample roughness. The EBSD data showed that the CdTe films were randomly oriented and had columnar growth and a high density of <111> twin boundaries.

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