Optical Investigations of In2Se2.7Sb0.3 Thin Films Prepared by Thermal Evaporation Technique

2019 ◽  
Vol 969 ◽  
pp. 355-360 ◽  
Author(s):  
Piyush Patel ◽  
Vimal Patel ◽  
Sandip Vyas ◽  
Jaydev Patel ◽  
Himanshu Pavagadhi
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Optical Band Gap ◽  
Thermal Evaporation ◽  
Radiation Detectors ◽  
Thermal Evaporation Technique ◽  
Clean Glass Substrate ◽  
Amorphous Nature ◽  
Evaporation Technique

The III-VI compound semiconductors are important for the fabrication of ionizing radiation detectors, solid-state electrodes, and photosensitive heterostructures, solar cell as well as ionic batteries. In this paper, In2Se2.7Sb0.3 thin films have been grown by thermal evaporation technique onto a with chemically clean glass substrate. Amorphous nature of the films has been discovered by UV-VIS spectrophotometer. The analysis by absorption spectra within the spectral range 200nm -900 nm has been used for the optical characterization of thin films. From these data the optical constants (absorption coefficient (α), refractive index (η), extinction coefficient (k)) and optical band gap (Eg) are studied. The results were discussed, and reported in detail.

Study of Structural and Optical Properties of Non-Oxide Se90Cd10–xSbx(2 ≤ x ≤ 8) Chalcogenide Thin Films

2020 ◽  
Vol 12 (1) ◽  
pp. 116-119
Author(s):  
Nitesh Shukla ◽  
Pravin Kumar Singh ◽  
H. P. Pathak ◽  
D. K. Dwivedi
Keyword(s):  
Thin Films ◽  
Thermal Evaporation ◽  
Optical Characterization ◽  
Structural And Optical Properties ◽  
Allowed Transition ◽  
Clean Glass Substrate ◽  
Amorphous Nature ◽  
Evaporation Technique ◽  
The Impact

Thin films of Se90Cd10–xSbx (2 ≤ x ≤ 8) of thickness 0.4 microns were prepared on ultra-clean glass substrate by thermal evaporation technique. The vacuum level was 10–6 torr. This paper intends to investigate the impact of Sb concentration on the optical characterization. XRD measurement has been done to investigate the Structural characterization of the prepared thin films. XRD result indicates the prepared thin have amorphous nature. To analyze the optical characterization of the thin films the absorption spectra were recorded over 400–1100 nm wavelength range. In the present study the optical absorption follows direct allowed transition. An increase in photon energy causes an increase in absorption coefficient while extinction coefficient has been found to increase with an increase in frequency of the photons i.e., deceases with increase of wavelength. Optical bandgap (Eg) of thin films have been studied and an increase in it has been recorded with increasing Sb concentration.

Electrical conductivity studies of mixed phthalocyanine thin films

Open Physics ◽  
2005 ◽  
Vol 3 (1) ◽  
Author(s):  
Abraham Varghese ◽  
C. Menon
Keyword(s):  
Thin Films ◽  
Electrical Conductivity ◽  
Room Temperature ◽  
Optical Band Gap ◽  
Thermal Evaporation ◽  
Copper Phthalocyanine ◽  
Thermal Evaporation Technique ◽  
Nickel Phthalocyanine ◽  
Mixed Films ◽  
Evaporation Technique

AbstractThin films of mixed of Copper Phthalocyanine (CuPc) and Nickel Phthalocyanine (NiPc) are deposited onto a pure glass substrate by a simultaneous thermal evaporation technique at room temperature. The material D.C. electrical conductivity of films at room temperature and also films annealed at 523 K has been investigated. The optical absorption and band gaps of the films are also measured. The results show that the electrical resistance is lower for the mixed films compared with the pure samples and also the optical band gap decreases for the mixed samples compared to the pure samples.

scholarly journals Effect of Ge Addition on the Optical Band Gap and Refractive Index of Thermally Evaporated Thin Films

2008 ◽  
Vol 2008 ◽  
pp. 1-4 ◽  
Author(s):  
Pankaj Sharma ◽  
S. C. Katyal
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Band Gap ◽  
Density Of States ◽  
Spectral Range ◽  
Transmission Spectrum ◽  
Optical Band Gap ◽  
Thermal Evaporation ◽  
Thermal Evaporation Technique ◽  
Evaporation Technique

The present paper reports the effect of Ge addition on the optical band gap and refractive index of thin films. Thin films of and were prepared by thermal evaporation technique at base pressure  Pa. Optical band gap and refractive index were calculated by analyzing the transmission spectrum in the spectral range 400–1500 nm. The optical band gap decreases while the refractive index increases with the addition of Ge to . The decrease of optical band gap has been explained on the basis of density of states; and the increase in refractive index has been explained on the basis increase in disorder in the system.

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