Accurate Extraction of MOSFET Unstressed Interface State Spatial Distribution from Charge Pumping Measurements

2011 ◽  
Vol 178-179 ◽  
pp. 267-272 ◽  
Author(s):  
Ivan Starkov ◽  
Stanislav Tyaginov ◽  
Hubert Enichlmair ◽  
Jong Mun Park ◽  
Hajdin Ceric ◽  
...  
Keyword(s):  
Extraction Procedure ◽  
Interface State ◽  
State Density ◽  
Interface State Density ◽  
Total Charge ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Degradation Modeling ◽  
Conventional Extraction ◽  
Oxide Trap

The interface state density profile for an unstressed transistor has been carefully extracted. The experimental evidence of profile non-uniformity is presented. A scheme to separate the bulk oxide trap contribution from the total charge pumping current is suggested as an improvement to the conventional extraction procedure. The obtained information is of high importance in the context of hot-carrier degradation modeling in order to allow for a more detailed verification of the model.

Determination of hot-carrier induced interface state density in polycrystalline silicon thin-film transistors

1998 ◽  
Vol 84 (4) ◽  
pp. 2341-2348 ◽  
Author(s):  
L. Mariucci ◽  
G. Fortunato ◽  
R. Carluccio ◽  
A. Pecora ◽  
S. Giovannini ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Interface State ◽  
State Density ◽  
Interface State Density ◽  
Silicon Thin Film ◽  
Hot Carrier

Characterization of interface state density of three-dimensional Si nanostructure by charge pumping measurement

2014 ◽  
Vol 54 (4) ◽  
pp. 725-729 ◽  
Author(s):  
Chunmeng Dou ◽  
Tomoya Shoji ◽  
Kazuhiro Nakajima ◽  
Kuniyuki Kakushima ◽  
Parhat Ahmet ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Interface State ◽  
State Density ◽  
Interface State Density ◽  
Charge Pumping

Dependence of Interface-State Density on Three Dimensional Silicon Structure Measured by Charge-Pumping Method

2019 ◽  
Vol 41 (7) ◽  
pp. 293-298 ◽  
Author(s):  
Kazuhiro Nakajima ◽  
Soshi Sato ◽  
Kuniyuki Kakushima ◽  
Parhat Ahmet ◽  
Kazuo Tsutsui ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Interface State ◽  
State Density ◽  
Interface State Density ◽  
Silicon Structure ◽  
Charge Pumping
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