Determination of hot-carrier induced interface state density in polycrystalline silicon thin-film transistors
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2007 ◽
Vol 46
(3B)
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pp. 1322-1327
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2003 ◽
Vol 50
(9)
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pp. 1991-1994
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2008 ◽
Vol 22
(30)
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pp. 5357-5364
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1996 ◽
Vol 51-52
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pp. 585-596
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