Application of Double Crucible in Cz Si Crystal Growth

2011 ◽  
Vol 178-179 ◽  
pp. 501-506
Author(s):  
A.I. Prostomolotov ◽  
N.A. Verezub

The numerical modeling of melt flow, heat transfer and impurity (phosphorus) diffusion in the double crucible of "Redmet-90M" Cz puller was carried out in an application to a 200 mm diameter Si single crystal growth. The double crucible consists of two coaxial crucibles having different sizes: 490 mm (external) and 300 mm (internal) inner diameters. The bottom of internal crucible has a central hole of Do = 6 and 12 mm diameter for melt inflow from the external crucible. During crystal pulling the granulated Si was added in the external crucible and a melt of the internal crucible was doped by phosphorus. Three-dimensional features of a rotating melt flow affecting on heat transfer and impurity diffusion in the internal crucible were analyzed. In particular, the melt precession and thermal asymmetry near the liquid-solid interface (LSI) in the internal crucible are discussed. It is shown that a significant phosphorus losses caused by its evaporation from a melt surface may be compensated by additional phosphorus doping in the internal crucible.

2007 ◽  
Vol 307 (1) ◽  
pp. 235-244 ◽  
Author(s):  
C.J. Jing ◽  
S. Ihara ◽  
K.-I. Sugioka ◽  
T. Tsukada ◽  
M. Kobayashi ◽  
...  

2018 ◽  
Vol 483 ◽  
pp. 9-15 ◽  
Author(s):  
Rhea Kappenberger ◽  
Saicharan Aswartham ◽  
Francesco Scaravaggi ◽  
Christian G.F. Blum ◽  
Mihai I. Sturza ◽  
...  

2000 ◽  
Vol 39 (Part 1, No. 2A) ◽  
pp. 372-377 ◽  
Author(s):  
Wei Wang ◽  
Masahito Watanabe ◽  
Taketoshi Hibiya ◽  
Takahiko Tanahashi

2016 ◽  
Vol 51 (8) ◽  
pp. 491-497 ◽  
Author(s):  
Huawei Yin ◽  
Mingwei Li ◽  
Chuan Zhou ◽  
Jie Song

2007 ◽  
Vol 131-133 ◽  
pp. 283-288 ◽  
Author(s):  
A.I. Prostomolotov ◽  
N.A. Verezub

The features of microdefect formation during dislocation-free Si single crystals are considered in connection with the specific thermal CZ growing conditions. For this purpose the thermal crystal growth histories are calculated by means of a global thermal mathematical model and then on their basis the intrinsic point defect recombination and microdefect formation are modeled numerically. Difficulty of such integrated approach is explained by of the complicated and conjugated thermal modeling and a presence of various temperature zones in growing single crystal, answering to various defect formation mechanisms.


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