scholarly journals Design and technological optimization of rubber-reinforced thin-layer movable joints in the structure of a pipeline vibration-isolating compensator

2021 ◽  
Vol 28 (3) ◽  
pp. 392-398
Author(s):  
Galina Shaidurova ◽  
Oleg Milman ◽  
Aleksey Kiryukhin ◽  
Aleksandr Shaidurov

Thin-layer rubber-metal elements have been widely used in various fields of technology, including helicopter construction, support parts for bridges, shock absorbers in industrial and civil construction. Their work reliability is determined by the design and technological performance features, which require experimental testing and parametric optimization. The article presents the samples and basic models testing results which were aimed at increasing the strength indicators stability of the adhesive ``rubber-metal'' joints and ensuring the failure-free operation of a rubber-metal product in the structure of a pipeline vibration-isolating compensator.

Author(s):  
Vladimirs Gonca ◽  
Jurijs Svabs ◽  
Romans Kobrinecs

There is described a method of generation the rigid feature “Force – Settlement” for thin- layer rubber-metal compensating elements, which consist of several rubber and non-elastomeric layers, operating when being pressed, taking into account the low compressibility of rubber layers and deformation of support non-elastomeric layers. Variational method of theory of elasticity for compressible materials is used. It is recommended to use the acquired analytic dependencies when analysing the element and designing multi- layer compensating elements, as well as when determining the value of Poisson coefficient for rubber-like materials.


2011 ◽  
Vol 46 (1) ◽  
pp. 38-44 ◽  
Author(s):  
Afroditi Synnefa ◽  
Theoni Karlessi ◽  
Niki Gaitani ◽  
Mat Santamouris ◽  
D.N. Assimakopoulos ◽  
...  

Author(s):  
William J. Baxter

In this form of electron microscopy, photoelectrons emitted from a metal by ultraviolet radiation are accelerated and imaged onto a fluorescent screen by conventional electron optics. image contrast is determined by spatial variations in the intensity of the photoemission. The dominant source of contrast is due to changes in the photoelectric work function, between surfaces of different crystalline orientation, or different chemical composition. Topographical variations produce a relatively weak contrast due to shadowing and edge effects.Since the photoelectrons originate from the surface layers (e.g. ∼5-10 nm for metals), photoelectron microscopy is surface sensitive. Thus to see the microstructure of a metal the thin layer (∼3 nm) of surface oxide must be removed, either by ion bombardment or by thermal decomposition in the vacuum of the microscope.


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