NEW CONCEPTS AND TEST METHODS OF CURVE PROFILE AREA DENSITY IN SURFACE: ESTIMATION OF AREAL DENSITY ON CURVED SPATIAL SURFACE

The concepts of curve profile, curve intercept, curve intercept density, curve profile area density, intersection density in containing intersection (or intersection density relied on intersection reference), curve profile intersection density in surface (or curve intercept intersection density relied on intersection of containing curve), and curve profile area density in surface (AS) were defined. AS expressed the amount of curve profile area of Y phase in the unit containing surface area, S(X). The test methods and formulas were deduced, e.g.: AS=ICI /IC=LCI /BC. In the formula, ICI and IC indicated the intersection numbers of test line with curve intercepts (or profiles in 2D) and with the containing curve respectively. BC denoted the length of containing curve, LCI being the length of curve intercepts. The formula means that AS are equal to the curve intercept density and equal to the curve profile intersection density in surface. Issues about AS application and its correction for shrinking tissues were discussed. Example for testing AS was given.

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Improvement of test methods and criteria for evaluation of resistance to flame propagation of long elements of the wiring system

Eastern-European Journal of Enterprise Technologies ◽

10.15587/1729-4061.2021.249105 ◽

2021 ◽

Vol 6 (10 (114)) ◽

pp. 57-68

Author(s):

Rostyslav Kravchenko ◽

Pavlo Illiuchenko ◽

Andrii Onyshchuk ◽

Oleksandr Zazymko

Keyword(s):

Correlation Coefficient ◽

Flame Propagation ◽

Areal Density ◽

Test Methods ◽

Outer Diameter ◽

Incorrect Decision ◽

Tissue Paper ◽

Electrical Wiring ◽

Criteria For Evaluation ◽

Wiring System

The test methods for flame propagation of long elements of the electrical wiring system, in particular, cables, cable conduits and ducts, are analyzed, and differences in them are found in the test conditions and criteria for evaluating the resistance to flame propagation. Using a substrate of a wooden board covered with a layer of tissue paper with an areal density of (21±9) g/m2, adopted for testing other elements of the electrical wiring system, a cable was identified that is not resistant to flame propagation. It is proposed to use this substrate for testing the flame propagation of cables instead of a substrate made of a double layer of filter paper with a surface density of (80±15) g/m2. In one of three experiments, a cable that was not resistant to flame propagation was found based on the criterion of the presence of ignition of the substrate located under it. To reduce the risk of making an incorrect decision on compliance, it is proposed that the assessment of long elements of the wiring system be carried out according to the rules established for cable ducts, trays and ladders in EN 50085-1 and IEC 61537. For the AVVG cable with an outer diameter of 10 mm to 60 mm, when it touches the blue flame cone of 1 kW, the correlation coefficient of the dependence of the length of the charred part on the diameter was 0.969. For a distance of 100 mm between the sample and the burner along its axis, a correlation coefficient of 0.985 was obtained. It is proposed to test cables under the second condition recommended in IEC 60695-11-2. For two conduits, flame propagation was revealed when exposed to a 1 kW flame for 120 s and 240 s. However, for these pipelines, flame propagation did not occur under standard conditions of exposure to such a flame for 20 s and 25 s. To identify long elements of the wiring system that are not resistant to flame propagation, it is proposed to test them at a duration of exposure to a flame of 1 kW, established for cables in IEC 60332-1-2

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Method for Prototyping and Testing the Information Minimalism Concept of Nuclear Power Plants

EPJ Web of Conferences ◽

10.1051/epjconf/202022503004 ◽

2020 ◽

Vol 225 ◽

pp. 03004

Author(s):

Gwi-sook Jang ◽

Gee-yong Park

Keyword(s):

Information Structure ◽

Nuclear Power ◽

Power Plants ◽

Operation Mode ◽

Careful Analysis ◽

Test Methods ◽

Application Range ◽

New Concepts ◽

Operational Test ◽

And Control

he information structure and visualization design in nuclear power plant is based on careful analysis and understanding of the work domain of the operator. Piping and instrumentation diagram (P&ID) based layouts tend to require more display space. Overuse of mimic layouts can result in visual clutter. P&ID based layouts of controls are usually less easily operated configurations than those provided by other array conventions. Thus, a display method is emerging to minimize P&ID based display. The information minimalism concept is a monitoring and controller display method for each operation mode based on log analyses of operator actions. This method provides the monitoring information and control means necessary for the operator, according to operation mode, to perform a specific operation. This method can reduce the time spent searching for information and the transition between display pages. The aim of this paper was to verify the feasibility of implementing new concepts by establishing an information minimalism prototype. The validity of the function, performance, and operational test methods were verified by testing one such information minimalism prototype. In this paper, we describe prototyping and testing methods for the information minimalism concept for NPPs. In the future, this concept is to be added to the concept of operator support with the existing display configuration and navigation, and thereby extend its application range while actually utilizing it.

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Advances in Shock Testing Facilities for Naval Shipboard Equipments

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.301-303.1220 ◽

2011 ◽

Vol 301-303 ◽

pp. 1220-1225 ◽

Cited By ~ 1

Author(s):

Gong Xian Wang ◽

Yong Hu

Keyword(s):

Shock Wave ◽

Test Methods ◽

Shock Pulse ◽

Shock Trial ◽

Shock Test ◽

Underwater Explosions ◽

Shock Testing ◽

New Concepts ◽

Negative Shock ◽

Shock Pulses

The capability to withstand non-contact underwater explosions (UNDEX) is an important aspect to be emphasized in the design of modern warships, and shock testing is one of the efficient methods to qualify the ability. A brief history on the research of shock testing of naval shipboard equipment as well as major means in evaluating anti-shock performance of warship equipment is introduced first in this paper. Three prevailing shock test methods: UNDEX testing, virtual shock trial and land-based test with shock test machines are presented with the focus on the advances in shock test machines in US and Europe. Comparison of current shock testing facilities is also given. Moreover, some new concepts of shock test machines are reviewed as well, and three major directions of the development of shock test machines are concluded. The first trend is that shock testing machines are required to generate positive and negative shock pulse to simulate real UNDEX environment made up of shock wave followed by bubble pulse and structural whipping. The second is that shock test machines can test heavy equipments, and the last is that shock pulses can be controlled and customized conveniently.

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Novel Approaches to Low-Voltage Scanning Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100180586 ◽

1990 ◽

Vol 48 (1) ◽

pp. 366-367

Author(s):

Arthur V. Jones

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Low Voltage ◽

Electron Optics ◽

Current Interest ◽

New Concepts ◽

Opportune Time ◽

Novel Approaches ◽

Voltage Scanning ◽

Scanning Electron

In comparison with the developers of other forms of instrumentation, scanning electron microscope manufacturers are among the most conservative of people. New concepts usually must wait many years before being exploited commercially. The field emission gun, developed by Albert Crewe and his coworkers in 1968 is only now becoming widely available in commercial instruments, while the innovative lens designs of Mulvey are still waiting to be commercially exploited. The associated electronics is still in general based on operating procedures which have changed little since the original microscopes of Oatley and his co-workers.The current interest in low-voltage scanning electron microscopy will, if sub-nanometer resolution is to be obtained in a useable instrument, lead to fundamental changes in the design of the electron optics. Perhaps this is an opportune time to consider other fundamental changes in scanning electron microscopy instrumentation.

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