Medical Fitness Systems, Which are Developed in a Network System Usinig a Personal Computer

A neural network system has been developed on a personal computer to identify 1129 infrared spectra. The system is composed of two steps of networks. The first step classifies 1129 spectra into 40 categories, and each unit of the output layer is connected to one of the 40 networks in the second step, which identify each spectrum. Each network is composed of three layers. The input, intermediate, and output layers are composed of 250, 40, and 40 units, respectively. Intensity data at 250 wavenumber points between 1800 and 550 cm−1 of the infrared spectra are entered into the input layer of each network. The training of the networks was carried out with the spectral data of 1129 compounds stored in the SDBS system, and thus the networks were successfully constructed. On the basis of the results, the system has been developed by preparing pre- and post-processing programs. The system can identify each unknown spectrum within 0.1 s, and is quite efficient for identifying infrared spectra on a personal computer.

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A personal computer network system for equitable allocation of cadaver organs

Medical Informatics ◽

10.3109/14639239109025304 ◽

1991 ◽

Vol 16 (3) ◽

pp. 299-305

Author(s):

M. Shimada ◽

K. Akazawa ◽

S. Moriguchi ◽

T. Odaka ◽

Y. Nose

Keyword(s):

Personal Computer ◽

Computer Network ◽

Network System ◽

Equitable Allocation

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Quantitative parallel EELS spectrum imaging developed as a new tool in AEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010013064x ◽

1992 ◽

Vol 50 (2) ◽

pp. 1202-1203

Author(s):

Gianluigi Botton ◽

Gilles L'espérance

Keyword(s):

Statistical Analysis ◽

Spatial Resolution ◽

Personal Computer ◽

Systematic Study ◽

Present Author ◽

Chemical Elements ◽

Detection Limits ◽

Research Groups ◽

Quantitative Performance ◽

Spectrum Imaging

As interest for parallel EELS spectrum imaging grows in laboratories equipped with commercial spectrometers, different approaches were used in recent years by a few research groups in the development of the technique of spectrum imaging as reported in the literature. Either by controlling, with a personal computer both the microsope and the spectrometer or using more powerful workstations interfaced to conventional multichannel analysers with commercially available programs to control the microscope and the spectrometer, spectrum images can now be obtained. Work on the limits of the technique, in terms of the quantitative performance was reported, however, by the present author where a systematic study of artifacts detection limits, statistical errors as a function of desired spatial resolution and range of chemical elements to be studied in a map was carried out The aim of the present paper is to show an application of quantitative parallel EELS spectrum imaging where statistical analysis is performed at each pixel and interpretation is carried out using criteria established from the statistical analysis and variations in composition are analyzed with the help of information retreived from t/γ maps so that artifacts are avoided.

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The quantitative comparison of experimental and simulated diffraction contrast images

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010013688x ◽

1995 ◽

Vol 53 ◽

pp. 102-103

Author(s):

Stuart McKernan

Keyword(s):

Image Processing ◽

Personal Computer ◽

Close Agreement ◽

Quantitative Comparison ◽

Image Simulation ◽

Computing Power ◽

Diffraction Contrast ◽

Simulated Images ◽

Made In

For many years the concept of quantitative diffraction contrast experiments might have consisted of the determination of dislocation Burgers vectors using a g.b = 0 criterion from several different 2-beam images. Since the advent of the personal computer revolution, the available computing power for performing image-processing and image-simulation calculations is enormous and ubiquitous. Several programs now exist to perform simulations of diffraction contrast images using various approximations. The most common approximations are the use of only 2-beams or a single systematic row to calculate the image contrast, or calculating the image using a column approximation. The increasing amount of literature showing comparisons of experimental and simulated images shows that it is possible to obtain very close agreement between the two images; although the choice of parameters used, and the assumptions made, in performing the calculation must be properly dealt with. The simulation of the images of defects in materials has, in many cases, therefore become a tractable problem.

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On-line alignment and astigmatism correction using a TV and personal computer

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100146850 ◽

1993 ◽

Vol 51 ◽

pp. 202-203

Author(s):

F. Hosokawa ◽

Y. Kondo ◽

T. Honda ◽

Y. Ishida ◽

M. Kersker

Keyword(s):

High Resolution ◽

Personal Computer ◽

Block Diagram ◽

Incident Beam ◽

Ccd Camera ◽

Alignment Procedure ◽

Astigmatism Correction ◽

Transmission Electron ◽

Alignment System ◽

On Line

High-resolution transmission electron microscopy must attain utmost accuracy in the alignment of incident beam direction and in astigmatism correction, and that, in the shortest possible time. As a method to eliminate this troublesome work, an automatic alignment system using the Slow-Scan CCD camera has been introduced recently. In this method, diffractograms of amorphous images are calculated and analyzed to detect misalignment and astigmatism automatically. In the present study, we also examined diffractogram analysis using a personal computer and digitized TV images, and found that TV images provided enough quality for the on-line alignment procedure of high-resolution work in TEM. Fig. 1 shows a block diagram of our system. The averaged image is digitized by a TV board and is transported to a computer memory, then a diffractogram is calculated using an FFT board, and the feedback parameters which are determined by diffractogram analysis are sent to the microscope(JEM- 2010) through the RS232C interface. The on-line correction system has the following three modes.

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