Transmission Electron Microscopy Characterization of High-Temperatur Oxidation of Fe-20Cr-5Al Alloy Prepared by Focused Ion Beam Technique

Mohammad Dani; Pudji Untoro; Teguh Yulius Surya Panca Putra; Parikin Parikin; Joachim Mayer; Arbi Dimyati

doi:10.7454/mst.v19i2.3038

Transmission Electron Microscopy Characterization of High-Temperatur Oxidation of Fe-20Cr-5Al Alloy Prepared by Focused Ion Beam Technique

Makara Journal of Technology ◽

10.7454/mst.v19i2.3038 ◽

2015 ◽

Vol 19 (2) ◽

pp. 85

Author(s):

Mohammad Dani ◽

Pudji Untoro ◽

Teguh Yulius Surya Panca Putra ◽

Parikin Parikin ◽

Joachim Mayer ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization ◽

Beam Technique

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Transmission Electron Microscopy Characterization of High-Temperatur Oxidation of Fe-20Cr-5Al Alloy Prepared by Focused Ion Beam Technique

Makara Journal of Technology ◽

10.7454/mst.v19i2.3141 ◽

2015 ◽

Vol 19 (2) ◽

pp. 85

Author(s):

Mohammad Dani ◽

Pudji Untoro ◽

Teguh Yulius Surya Panca Putra ◽

Parikin Parikin ◽

Joachim Mayer ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization ◽

Beam Technique

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Transmission Electron Microscopy Characterization of Hydrothermal-treated Aluminum Film

10.1557/proc-1231-nn03-11 ◽

2009 ◽

Author(s):

Takashi Ishiguro ◽

Zhiyong Qiu ◽

Junichi Shimanuki ◽

Yusuke Hosoki

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Aluminum Film ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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Metallurgical study of Ni/(Ga,Al) As contacts. III. Transmission electron microscopy characterization of ternary superstructured phases in the reacted layers

Journal of Applied Physics ◽

10.1063/1.349718 ◽

1991 ◽

Vol 70 (12) ◽

pp. 7613-7619 ◽

Cited By ~ 13

Author(s):

A. Poudoulec ◽

B. Guenais ◽

A. Guivarc’h ◽

J. Caulet ◽

R. Guérin

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Metallurgical Study ◽

Microscopy Characterization

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Transmission Electron Microscopy Characterization of Position-Controlled InN Nanocolumns

Japanese Journal of Applied Physics ◽

10.1143/jjap.47.5330 ◽

2008 ◽

Vol 47 (7) ◽

pp. 5330-5332 ◽

Cited By ~ 18

Author(s):

Satoshi Harui ◽

Hidetoshi Tamiya ◽

Takanobu Akagi ◽

Hideto Miyake ◽

Kazumasa Hiramatsu ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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The use of the focused ion beam technique to prepare cross-sectional transmission electron microscopy specimen of polymer solar cells deposited on glass

Polymer ◽

10.1016/s0032-3861(02)00643-2 ◽

2002 ◽

Vol 43 (26) ◽

pp. 7493-7496 ◽

Cited By ~ 38

Author(s):

Joachim Loos ◽

Jeroen K.J van Duren ◽

Francis Morrissey ◽

René A.J Janssen

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Solar Cells ◽

Focused Ion Beam ◽

Polymer Solar Cells ◽

Ion Beam ◽

Transmission Electron Microscopy Specimen ◽

Cross Sectional ◽

Transmission Electron ◽

Beam Technique

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Impact of a Combined Use of Focused Ion Beam Technique and Transmission Electron Microscopy on Materials Characterization

Materials Science Forum - PRICM-5 ◽

10.4028/0-87849-960-1.9 ◽

2005 ◽

pp. 9-20

Author(s):

Hiroyasu Saka

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Materials Characterization ◽

Transmission Electron ◽

Combined Use ◽

Beam Technique

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Efficient Transmission Electron Microscopy Characterization of Cell–Nanostructure Interfacial Interactions

Journal of the American Chemical Society ◽

10.1021/jacs.0c05919 ◽

2020 ◽

Vol 142 (37) ◽

pp. 15649-15653

Author(s):

Stella Aslanoglou ◽

Yaping Chen ◽

Viola Oorschot ◽

Zlatan Trifunovic ◽

Eric Hanssen ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Interfacial Interactions ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization ◽

Efficient Transmission

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High resolution transmission electron microscopy characterization of fcc → 9R transformation in nanocrystalline palladium films due to hydriding

Applied Physics Letters ◽

10.1063/1.4793512 ◽

2013 ◽

Vol 102 (7) ◽

pp. 071911 ◽

Cited By ~ 16

Author(s):

Behnam Amin-Ahmadi ◽

Hosni Idrissi ◽

Renaud Delmelle ◽

Thomas Pardoen ◽

Joris Proost ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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Reducing of ion beam induced surface damaging using “low voltage” focused ion beam technique for transmission electron microscopy sample preparation

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85156-1_343 ◽

2009 ◽

pp. 685-686

Author(s):

R. Salzer ◽

M. Simon ◽

A. Graff ◽

F. Altmann ◽

L. Pastewka ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Sample Preparation ◽

Focused Ion Beam ◽

Low Voltage ◽

Ion Beam ◽

Transmission Electron Microscopy Sample ◽

Transmission Electron ◽

Beam Technique

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Transmission electron microscopy characterization of GaN nanowires

Journal of Electronic Materials ◽

10.1007/s11664-002-0089-4 ◽

2002 ◽

Vol 31 (5) ◽

pp. 391-394 ◽

Cited By ~ 2

Author(s):

Z. Liliental-Weber ◽

Y. H. Gao ◽

Y. Bando

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Gan Nanowires ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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