Surface Potential Measurement of Tris(8-hydroxyquinolinato)aluminum and Bis[N-(1-naphthyl)-N-phenyl]benzidine Thin Films Fabricated on Indium–Tin Oxide by Kelvin Probe Force Microscopy

2011 ◽  
Vol 50 (7R) ◽  
pp. 071601 ◽  
Author(s):  
Shigetaka Katori ◽  
Nobuo Satoh ◽  
Masayuki Yahiro ◽  
Kei Kobayashi ◽  
Hirofumi Yamada ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Potential ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Potential Measurement ◽  
Force Microscopy

Surface Potential Measurement of Oligothiophene Ultrathin Films by Kelvin Probe Force Microscopy

2001 ◽  
Vol 40 (Part 1, No. 6B) ◽  
pp. 4381-4383 ◽  
Author(s):  
Keiichi Umeda ◽  
Kei Kobayashi ◽  
Kenji Ishida ◽  
Shu Hotta ◽  
Hirofumi Yamada ◽  
...  
Keyword(s):  
Surface Potential ◽  
Ultrathin Films ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Potential Measurement ◽  
Force Microscopy

Surface Potential Measurement of Carbon Nanotube Field-Effect Transistors Using Kelvin Probe Force Microscopy

2007 ◽  
Vol 46 (4B) ◽  
pp. 2496-2500 ◽  
Author(s):  
Takeo Umesaka ◽  
Hirofumi Ohnaka ◽  
Yutaka Ohno ◽  
Shigeru Kishimoto ◽  
Koichi Maezawa ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Surface Potential ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Potential Measurement ◽  
Force Microscopy
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