Room-temperature photoluminescence evaluation of small-angle grain boundaries in multicrystalline silicon

2014 ◽  
Vol 53 (11) ◽  
pp. 112401 ◽  
Author(s):  
Masaki Funakoshi ◽  
Norihiro Ikeno ◽  
Tomihisa Tachibana ◽  
Yoshio Ohshita ◽  
Koji Arafune ◽  
...  
2012 ◽  
Vol 5 (4) ◽  
pp. 042301 ◽  
Author(s):  
Takashi Sameshima ◽  
Naoto Miyazaki ◽  
Yuki Tsuchiya ◽  
Hiroki Hashiguchi ◽  
Tomihisa Tachibana ◽  
...  

2005 ◽  
Vol 52 (12) ◽  
pp. 1211-1215 ◽  
Author(s):  
J CHEN ◽  
T SEKIGUCHI ◽  
R XIE ◽  
P AHMET ◽  
T CHIKYO ◽  
...  

2009 ◽  
Vol 156-158 ◽  
pp. 561-565
Author(s):  
Takashi Sekiguchi ◽  
Woong Lee ◽  
Jun Chen ◽  
Bin Chen

We have characterized optical property of small-angle (SA) grain-boundaries (GBs) in high-pure multicrystalline Si by using cathodoluminescence (CL). Prior to CL measurement, the electrical activity of GBs were evaluated by using electron-beam-induced current (EBIC). The SA-GBs are categorized into two groups with room temperature (RT-) EBIC contrast. The SA-GBs with misorientation angle about 1º give weak RT-EBIC contrast and yield D3 and D4. The SA-GBs with 2.5º show strong EBIC contrast and yield D1 and D2. These correspondences reflect the dislocation density at the SA-GBs. We also found the curious distribution of D1 emission in some special GBs, which is now difficult to explain. It is noticed that large-angle GBs do not show any D-line emissions at all.


2015 ◽  
Vol 54 (8S1) ◽  
pp. 08KD16 ◽  
Author(s):  
Takuto Kojima ◽  
Tomihisa Tachibana ◽  
Yoshio Ohshita ◽  
Ronit R. Prakash ◽  
Takashi Sekiguchi ◽  
...  

2019 ◽  
Vol 41 (4) ◽  
pp. 29-36 ◽  
Author(s):  
Takashi Sameshima ◽  
Yuki Tsuchiya ◽  
Naoto Miyazaki ◽  
Tomihisa Tachibana ◽  
Yoshio Ohshita ◽  
...  

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