Hot carrier effect and positive bias temperature instability of a thin-film silicon-on-insulator power MOSFET at high temperature

2015 ◽  
Vol 54 (4S) ◽  
pp. 04DP17 ◽  
Author(s):  
Wataru Yoshida ◽  
Tomoya Takasugi ◽  
Satoshi Matsumoto
Keyword(s):  
Thin Film ◽  
High Temperature ◽  
Silicon On Insulator ◽  
Positive Bias ◽  
Temperature Instability ◽  
Power Mosfet ◽  
Hot Carrier ◽  
Bias Temperature Instability ◽  
Carrier Effect ◽  
Hot Carrier Effect

Hot-Carrier Effect of an Ultra-Thin-Film SOI Power MOSFET

1996 ◽  
Author(s):  
Satoshi Matsumoto ◽  
Hideki Yaginuma ◽  
Toshiaki Yachi
Keyword(s):  
Thin Film ◽  
Power Mosfet ◽  
Hot Carrier ◽  
Carrier Effect ◽  
Hot Carrier Effect ◽  
Ultra Thin Film

Positive bias temperature instability of irradiated n-channel thin film transistors

2014 ◽  
Vol 556 ◽  
pp. 535-538 ◽  
Author(s):  
Emil V. Jelenković ◽  
Milan S. Kovačević ◽  
Dragan Z. Stupar ◽  
Shrawan Jha ◽  
Jovan S. Bajić ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Positive Bias ◽  
Temperature Instability ◽  
Bias Temperature Instability
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