Positive bias temperature instability of irradiated n-channel thin film transistors
Keyword(s):
2010 ◽
Vol 157
(2)
◽
pp. J29
◽
2010 ◽
Vol 18
(10)
◽
pp. 773
◽
2017 ◽
Vol 48
(1)
◽
pp. 1238-1241
◽