Retraction: “Chemical Activity of Oxygen Atoms in Magnetron Sputter-Deposited ZnO Films during Film Growth”

2016 ◽  
Vol 55 (8) ◽  
pp. 089202 ◽  
Author(s):  
Aya Morita ◽  
Ikuo Watanabe ◽  
Naoki Ohta ◽  
Hajime Shirai
2011 ◽  
Vol 50 (8) ◽  
pp. 08JD02 ◽  
Author(s):  
Aya Morita ◽  
Ikuo Watanabe ◽  
Naoki Ohta ◽  
Hajime Shirai

2011 ◽  
Vol 50 (8S1) ◽  
pp. 08JD02 ◽  
Author(s):  
Aya Morita ◽  
Ikuo Watanabe ◽  
Naoki Ohta ◽  
Hajime Shirai

2011 ◽  
Vol 519 (20) ◽  
pp. 6903-6909 ◽  
Author(s):  
Aya Morita ◽  
Ikuo Watanabe ◽  
Hajime Shirai

2010 ◽  
Vol 108 (3) ◽  
pp. 033521 ◽  
Author(s):  
Jin Jie ◽  
Aya Morita ◽  
Hajime Shirai

2014 ◽  
Vol 98 ◽  
pp. 102-106 ◽  
Author(s):  
Z. Liu ◽  
H. Liu ◽  
T. Hashimoto ◽  
G.E. Thompson ◽  
P. Skeldon

Author(s):  
Kah-Yoong Chan ◽  
Cheng-Yang Low ◽  
Benedict Wen-Cheun Au ◽  
Zi-Neng Ng ◽  
Mian-En Yeoh ◽  
...  

2017 ◽  
Vol 414 ◽  
pp. 114-123 ◽  
Author(s):  
Ajaib Singh ◽  
Susanne Schipmann ◽  
Aakash Mathur ◽  
Dipayan Pal ◽  
Amartya Sengupta ◽  
...  

1989 ◽  
Vol 67 (4) ◽  
pp. 347-350 ◽  
Author(s):  
M. J. Brett ◽  
K. L. Westra ◽  
T. Smy

Ballistic deposition of hard discs has been used for computer simulation of thin film growth over a step on a substrate surface. Up to 16 000 particles were deposited per simulation using an angular distribution of particle trajectories representative of planar magnetron sputter deposition and incorporating a surface mobility model for deposited particles. The simulated films show a surface profile evolution during growth and an orientation of columnar film microstructure that are very close to the surface profile and microstructure observed in real films of aluminum sputter deposited over an oxide step on a silicon substrate.


Sign in / Sign up

Export Citation Format

Share Document