Characterization of GaAs/AlAs Interface Structure by High Resolution Transmission Electron Microscopy
2015 ◽
Vol 95
(3)
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pp. 145-151
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2003 ◽
Vol 255
(1-2)
◽
pp. 93-101
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2009 ◽
Vol 15
(S2)
◽
pp. 368-369
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