Characterization of Dental Bonded Interface Degradation Using Focused Ion Beam and High-Resolution Transmission Electron Microscopy

S Duarte; A Avishai; A Sadan

doi:10.1017/s1431927609098031

Characterization of Dental Bonded Interface Degradation Using Focused Ion Beam and High-Resolution Transmission Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927609098031 ◽

2009 ◽

Vol 15 (S2) ◽

pp. 368-369 ◽

Cited By ~ 1

Author(s):

S Duarte ◽

A Avishai ◽

A Sadan

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Focused Ion Beam ◽

Ion Beam ◽

Bonded Interface ◽

Transmission Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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Characterization of the Surface Properties of Commercially Available Dental Implants Using Scanning Electron Microscopy, Focused Ion Beam, and High-Resolution Transmission Electron Microscopy

Clinical Implant Dentistry and Related Research ◽

10.1111/j.1708-8208.2007.00056.x ◽

2008 ◽

Vol 10 (1) ◽

pp. 11-22 ◽

Cited By ~ 59

Author(s):

Tobias Jarmar ◽

Anders Palmquist ◽

Rickard Brånemark ◽

Leif Hermansson ◽

Håkån Engqvist ◽

...

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Surface Properties ◽

Focused Ion Beam ◽

Ion Beam ◽

Transmission Electron ◽

Scanning Electron

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Application of transmission electron microscopy and focused ion beam tomography for microstructure characterization of tungsten based materials

Physica Scripta ◽

10.1088/0031-8949/2011/t145/014043 ◽

2011 ◽

Vol T145 ◽

pp. 014043

Author(s):

S Milc ◽

A Kruk ◽

G Cempura ◽

H J Penkalla ◽

C Thomser ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Microstructure Characterization ◽

Transmission Electron ◽

Focused Ion Beam Tomography

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Microstructural Characterization of Ti-6Al-4V Metal Chips by Focused Ion Beam and Transmission Electron Microscopy

Metallurgical and Materials Transactions A ◽

10.1007/s11661-011-0765-1 ◽

2011 ◽

Vol 42 (11) ◽

Cited By ~ 6

Author(s):

Judy Schneider ◽

Lei Dong ◽

Jane Y. Howe ◽

Harry M. Meyer

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Microstructural Characterization ◽

Transmission Electron ◽

Metal Chips

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Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling

Journal of Electron Microscopy ◽

10.1093/jmicro/dfh067 ◽

2004 ◽

Vol 53 (5) ◽

pp. 497-500 ◽

Cited By ~ 33

Author(s):

H. Sasaki

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Focused Ion Beam ◽

Ion Beam ◽

Specimen Preparation ◽

Ion Milling ◽

Transmission Electron

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Characterization of Nanoparticle Films and Structures Using Focused Ion Beam Milling and Transmission Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927602103795 ◽

2002 ◽

Vol 8 (S02) ◽

pp. 1144-1145 ◽

Cited By ~ 2

Author(s):

C. R. Perrey ◽

C. B. Carter ◽

P. G. Kotula ◽

J. R. Michael

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Nanoparticle Films ◽

Transmission Electron ◽

Focused Ion Beam Milling

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Characterization of graphite implanted with chlorine ions using combined Raman microspectrometry and transmission electron microscopy on thin sections prepared by focused ion beam

Carbon ◽

10.1016/j.carbon.2009.11.049 ◽

2010 ◽

Vol 48 (4) ◽

pp. 1244-1251 ◽

Cited By ~ 30

Author(s):

M.R. Ammar ◽

J.N. Rouzaud ◽

C.E. Vaudey ◽

N. Toulhoat ◽

N. Moncoffre

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Thin Sections ◽

Transmission Electron ◽

Chlorine Ions ◽

Raman Microspectrometry

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Novel Large-Area High-Resolution-Transmission-Electron-Microscopy Technique using Specimens Fabricated by a Focused Ion Beam Apparatus

Japanese Journal of Applied Physics ◽

10.1143/jjap.40.1100 ◽

2001 ◽

Vol 40 (Part 1, No. 2B) ◽

pp. 1100-1103 ◽

Cited By ~ 2

Author(s):

Hisayuki Suematsu ◽

Koichi Udo ◽

Kunihiro Hisatsune ◽

Kiyoshi Yatsui ◽

Hisao Yamauchi

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Focused Ion Beam ◽

Ion Beam ◽

Large Area ◽

Transmission Electron Microscopy Technique ◽

Microscopy Technique ◽

Transmission Electron

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Transmission Electron Microscopy Characterization of High-Temperatur Oxidation of Fe-20Cr-5Al Alloy Prepared by Focused Ion Beam Technique

Makara Journal of Technology ◽

10.7454/mst.v19i2.3038 ◽

2015 ◽

Vol 19 (2) ◽

pp. 85

Author(s):

Mohammad Dani ◽

Pudji Untoro ◽

Teguh Yulius Surya Panca Putra ◽

Parikin Parikin ◽

Joachim Mayer ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization ◽

Beam Technique

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Broad ion beam milling of focused ion beam prepared transmission electron microscopy cross-section specimens for high resolution electron microscopy using silicon support membranes

Microscopy of Semiconducting Materials 2001 ◽

10.1201/9781351074629-110 ◽

2018 ◽

pp. 511-514

Author(s):

R M Langford ◽

D Ozkaya ◽

B Huey ◽

A K Petford-Long

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Cross Section ◽

Focused Ion Beam ◽

Ion Beam ◽

High Resolution Electron Microscopy ◽

Transmission Electron ◽

Resolution Electron ◽

Transmission Electron Microscopy Cross

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Transmission Electron Microscopy Characterization of High-Temperatur Oxidation of Fe-20Cr-5Al Alloy Prepared by Focused Ion Beam Technique

Makara Journal of Technology ◽

10.7454/mst.v19i2.3141 ◽

2015 ◽

Vol 19 (2) ◽

pp. 85

Author(s):

Mohammad Dani ◽

Pudji Untoro ◽

Teguh Yulius Surya Panca Putra ◽

Parikin Parikin ◽

Joachim Mayer ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization ◽

Beam Technique

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