The XPS Study on Depth Profile of N Atom in Oxynitride Film Formed on 4H-SiC by Radical Nitridation

2013 ◽  
Author(s):  
H. Okada ◽  
A. Takashima ◽  
T. Muro ◽  
H. Nohira
Keyword(s):  
Depth Profile ◽  
Oxynitride Film ◽  
Xps Study

scholarly journals X-ray Photoelectron Spectroscopic Study of Nitrogen Depth Profile in Radical Nitrided Silicon Oxynitride Film

Shinku ◽  
2007 ◽  
Vol 50 (11) ◽  
pp. 672-677 ◽  
Author(s):  
Kazumasa KAWASE ◽  
Hiroshi UMEDA ◽  
Masao INOUE ◽  
Tomoyuki SUWA ◽  
Akinobu TERAMOTO ◽  
...  
Keyword(s):  
Spectroscopic Study ◽  
Depth Profile ◽  
Silicon Oxynitride ◽  
X Ray ◽  
Oxynitride Film

XPS study of the in-depth profile of TiO2−Al2O3 catalysts prepared by different methods

1981 ◽  
Vol 16 (1) ◽  
pp. 73-76 ◽  
Author(s):  
E. Rodenas ◽  
H. Hattori ◽  
I. Toyoshima
Keyword(s):  
Depth Profile ◽  
Xps Study

The effect of surface roughness on AES depth profile.

Shinku ◽  
1987 ◽  
Vol 30 (10) ◽  
pp. 793-798 ◽  
Author(s):  
Masao HIRASAKA ◽  
Masao HASHIBA ◽  
Toshiroh YAMASHINA
Keyword(s):  
Surface Roughness ◽  
Depth Profile ◽  
Effect Of Surface

scholarly journals Depth profile of thin coating through surface and interfacial cutting analysis of UV curing system

2019 ◽  
Vol 178 ◽  
pp. 107855
Author(s):  
Ji-Won Park ◽  
Kyeng-Bo Sim ◽  
Gyu-Seong Shim ◽  
Jong-Ho Back ◽  
Dooyoung Baek ◽  
...  
Keyword(s):  
Depth Profile ◽  
Uv Curing ◽  
Thin Coating

Quantitative XPS study of the composition in bismuth superconductors

1996 ◽  
Vol 4 (5-6) ◽  
pp. 203-211
Author(s):  
Zhanglian Hong ◽  
Minquan Wang ◽  
Gouhong Xiong ◽  
Zhenggou Ji ◽  
Jun Yuan ◽  
...  
Keyword(s):  
Xps Study

scholarly journals Continuous borehole optical televiewing reveals variable englacial debris concentrations at Khumbu Glacier, Nepal

2021 ◽  
Vol 2 (1) ◽  
Author(s):  
Katie E. Miles ◽  
Bryn Hubbard ◽  
Evan S. Miles ◽  
Duncan J. Quincey ◽  
Ann V. Rowan ◽  
...  
Keyword(s):  
Vertical Distribution ◽  
Water Supply ◽  
Depth Profile ◽  
Variable Thickness ◽  
Surface Melting ◽  
High Mountain ◽  
Ablation Area ◽  
The Mean ◽  
Surface Melt ◽  
The Vertical Distribution

AbstractSurface melting of High Mountain Asian debris-covered glaciers shapes the seasonal water supply to millions of people. This melt is strongly influenced by the spatially variable thickness of the supraglacial debris layer, which is itself partially controlled by englacial debris concentration and melt-out. Here, we present measurements of deep englacial debris concentrations from debris-covered Khumbu Glacier, Nepal, based on four borehole optical televiewer logs, each up to 150 m long. The mean borehole englacial debris content is ≤ 0.7% by volume in the glacier’s mid-to-upper ablation area, and increases to 6.4% by volume near the terminus. These concentrations are higher than those reported for other valley glaciers, although those measurements relate to discrete samples while our approach yields a continuous depth profile. The vertical distribution of englacial debris increases with depth, but is also highly variable, which will complicate predictions of future rates of surface melt and debris exhumation at such glaciers.

XPS study of Cu/substrate systems obtained by pulsed laser deposition

2004 ◽  
Vol 36 (8) ◽  
pp. 1199-1202 ◽  
Author(s):  
X. Ch. Lai ◽  
M. A. Pushkin ◽  
V. I. Troyan
Keyword(s):  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Cu Substrate ◽  
Xps Study

Depth profile of acceptor concentration in InGaN/GaN multiple quantum wells

2021 ◽  
pp. 118127
Author(s):  
F. Hájek ◽  
A. Hospodková ◽  
T. Hubáček ◽  
J. Oswald ◽  
J. Pangrác ◽  
...  
Keyword(s):  
Quantum Wells ◽  
Depth Profile ◽  
Multiple Quantum Wells ◽  
Multiple Quantum ◽  
Acceptor Concentration
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