scholarly journals Induced Charge Distribution Using Accelerated Uzawa Method

Author(s):  
Jae-Hyun Kim ◽  
Gwanghyun Jo ◽  
Youn Doh Ha
2019 ◽  
Vol 7 (29) ◽  
pp. 17570-17580 ◽  
Author(s):  
Tao Meng ◽  
Jinwen Qin ◽  
Zhen Yang ◽  
Lirong Zheng ◽  
Minhua Cao

The effects of oxygen vacancy-induced charge distribution and metal catalysis improve the Li-ion diffusion and reversibility of Li2O in MoO2.


1983 ◽  
Vol 206 (3) ◽  
pp. 451-463 ◽  
Author(s):  
J. Chiba ◽  
H. Iwasaki ◽  
T. Kageyama ◽  
S. Kuribayashi ◽  
K. Nakamura ◽  
...  

2001 ◽  
Author(s):  
S. Bednarek ◽  
B. Szafran ◽  
J. Adamowski

1978 ◽  
Vol 59 (2) ◽  
pp. 389-411 ◽  
Author(s):  
I. C. Simpson ◽  
S. Simons ◽  
I. P. Williams

2012 ◽  
Vol 24 (10) ◽  
pp. 1328-1332 ◽  
Author(s):  
Luying Li ◽  
Lei Jin ◽  
Jianbo Wang ◽  
David J. Smith ◽  
Wan-Jian Yin ◽  
...  

2000 ◽  
Vol 341-348 ◽  
pp. 275-276 ◽  
Author(s):  
H.M. Shao ◽  
S.A. Aruna ◽  
C.J. Wang ◽  
M.S. Zhuo ◽  
X.L. Sun ◽  
...  

2012 ◽  
Vol 27 (1) ◽  
pp. 33-39 ◽  
Author(s):  
Tijana Kevkic ◽  
Mihajlo Odalovic ◽  
Dragan Petkovic

A stochastic model of gamma-ray radiation effects on the density of the induced charge in silicon dioxide films of MOS transistors is presented in this paper. It is assumed that both radiation induced charge generation and trapped charge recombination are stochastic processes. For estimating gamma-ray induced charges spatially distributed in silicon dioxide films, a procedure similar to the Monte Carlo method was used. The proposed model implemented in the programming language MATHEMATICA enables us, for the first time, to show the gamma-ray induced charge distribution as a function of gamma-ray doses. Using the developed model, we have also calculated the corresponding threshold voltage shifts of MOS transistors. These results were compared with the experimentally determined threshold voltage shift of MOS transistors with different voltages applied during irradiation vs. gamma radiation doses. Satisfactory agreements were obtained.


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