Oxygen Pathway in Ag Cathode using Oxygen Isotope Exchange and Secondary Ion Mass Spectroscopy

2019 ◽  
Vol 25 (2) ◽  
pp. 2667-2674 ◽  
Author(s):  
Minoru Muranaka ◽  
Kazuya Sasaki ◽  
Akihiro Suzuki ◽  
Takayuki Terai
Keyword(s):  
Oxygen Isotope ◽  
Mass Spectroscopy ◽  
Isotope Exchange ◽  
Secondary Ion Mass Spectroscopy ◽  
Oxygen Isotope Exchange ◽  
Secondary Ion

Determination of Oxygen Pathway in Silver Cathodes by Secondary-Ion Mass Spectroscopy Using Oxygen Isotope Exchange

2011 ◽  
Vol 158 (11) ◽  
pp. B1380 ◽  
Author(s):  
Kazuya Sasaki ◽  
Minoru Muranaka ◽  
Akihiro Suzuki ◽  
Takayuki Terai
Keyword(s):  
Oxygen Isotope ◽  
Mass Spectroscopy ◽  
Isotope Exchange ◽  
Secondary Ion Mass Spectroscopy ◽  
Oxygen Isotope Exchange ◽  
Silver Cathodes ◽  
Secondary Ion

scholarly journals Lithium diffusion coefficient in amorphous lithium phosphate thin films measured by secondary ion mass spectroscopy with isotope exchange methods

2016 ◽  
Vol 294 ◽  
pp. 59-66 ◽  
Author(s):  
Naoaki Kuwata ◽  
Xiaoli Lu ◽  
Takamichi Miyazaki ◽  
Yoshiki Iwai ◽  
Tadao Tanabe ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffusion Coefficient ◽  
Mass Spectroscopy ◽  
Isotope Exchange ◽  
Secondary Ion Mass Spectroscopy ◽  
Lithium Phosphate ◽  
Lithium Diffusion Coefficient ◽  
Lithium Diffusion ◽  
Secondary Ion

Coupled cation and oxygen-isotope exchange between alkali feldspar and aqueous chloride solution

2004 ◽  
Vol 89 (11-12) ◽  
pp. 1822-1825 ◽  
Author(s):  
Theodore C. Labotka ◽  
David R. Cole ◽  
Mostafa Fayek ◽  
Lee R. Riciputi ◽  
Frank J. Stadermann
Keyword(s):  
Oxygen Isotope ◽  
Isotope Exchange ◽  
Chloride Solution ◽  
Alkali Feldspar ◽  
Oxygen Isotope Exchange ◽  
Aqueous Chloride Solution ◽  
Aqueous Chloride

Development of secondary ion mass spectroscopy using medium energy C60 ion impact

2008 ◽  
Vol 266 (10) ◽  
pp. 2450-2452 ◽  
Author(s):  
K. Hirata ◽  
Y. Saitoh ◽  
A. Chiba ◽  
M. Adachi ◽  
K. Yamada ◽  
...  
Keyword(s):  
Mass Spectroscopy ◽  
Medium Energy ◽  
Secondary Ion Mass Spectroscopy ◽  
Ion Impact ◽  
Secondary Ion

Effect of Point Defect Injection on B diffusion in C containing Si and SiGe

2004 ◽  
Vol 809 ◽  
Author(s):  
Mudith S. A. Karunaratne ◽  
Janet M. Bonar ◽  
Jing Zhang ◽  
Arthur F. W. Willoughby
Keyword(s):  
Computer Simulation ◽  
Point Defect ◽  
Mass Spectroscopy ◽  
Diffusion Coefficients ◽  
Secondary Ion Mass Spectroscopy ◽  
Annealing Conditions ◽  
Defect Injection ◽  
Before And After ◽  
Secondary Ion

ABSTRACTIn this paper, we compare B diffusion in epitaxial Si, Si with 0.1%C, SiGe with 11% Ge and SiGe:C with 11%Ge and 0.1%C at 1000°C under interstitial, vacancy and non-injection annealing conditions. Diffusion coefficients of B in each material were extracted by computer simulation, using secondary ion mass spectroscopy (SIMS) profiles obtained from samples before and after annealing.Interstitial injection enhances B diffusion considerably in all materials compared to inert annealing. In samples which experienced vacancy injection, B diffusion was suppressed. The results are consistent with the view that B diffusion in these materials occurs primarily via interstitialcy type defects.

scholarly journals Quantification of nitrogen impurity and estimated Orowan strengthening through secondary ion mass spectroscopy in aluminum cryomilled for extended durations

2015 ◽  
Vol 648 ◽  
pp. 412-417 ◽  
Author(s):  
Clara Hofmeister ◽  
Mikhail Klimov ◽  
Tim Deleghanty ◽  
Kyu Cho ◽  
Yongho Sohn
Keyword(s):  
Mass Spectroscopy ◽  
Secondary Ion Mass Spectroscopy ◽  
Nitrogen Impurity ◽  
Secondary Ion
Sign in / Sign up

Export Citation Format

Share Document