Quantitative Evaluation of Molecular Diffusion in Organic Planar Heterojunctions by Time-of-Flight Secondary Ion Mass Spectroscopy

ACS Omega ◽

10.1021/acsomega.7b01524 ◽

2018 ◽

Vol 3 (2) ◽

pp. 1522-1528 ◽

Author(s):

Kyohei Nakano ◽

Takahiro Shibamori ◽

Keisuke Tajima

Keyword(s):

Quantitative Evaluation ◽

Mass Spectroscopy ◽

Molecular Diffusion ◽

Time Of Flight ◽

Secondary Ion Mass Spectroscopy ◽

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Secondary ion counting for surface-sensitive chemical analysis of organic compounds using time-of-flight secondary ion mass spectroscopy with cluster ion impact ionization

Review of Scientific Instruments ◽

10.1063/1.3541799 ◽

2011 ◽

Vol 82 (3) ◽

pp. 033101 ◽

Author(s):

K. Hirata ◽

Y. Saitoh ◽

A. Chiba ◽

K. Yamada ◽

Y. Takahashi ◽

...

Keyword(s):

Chemical Analysis ◽

Organic Compounds ◽

Mass Spectroscopy ◽

Impact Ionization ◽

Time Of Flight ◽

Secondary Ion Mass Spectroscopy ◽

Cluster Ion ◽

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Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy

10.1520/e2695 ◽

2009 ◽

Author(s):

Keyword(s):

Spectral Data ◽

Mass Spectroscopy ◽

Time Of Flight ◽

Mass Spectral Data ◽

Secondary Ion Mass Spectroscopy ◽

Mass Spectral ◽

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An investigation of the wear track on DLC (a-C:H) film by time-of-flight secondary ion mass spectroscopy

Surface and Coatings Technology ◽

10.1016/s0257-8972(01)01422-0 ◽

2001 ◽

Vol 146-147 ◽

pp. 378-383 ◽

Author(s):

Haruyo Fukui ◽

Miki Irie ◽

Yoshiharu Utsumi ◽

Kazuhiko Oda ◽

Hisanori Ohara

Keyword(s):

Mass Spectroscopy ◽

Time Of Flight ◽

Secondary Ion Mass Spectroscopy ◽

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Determination of silicon oxide layer thickness by time-of-flight secondary ion mass spectroscopy

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.590891 ◽

1999 ◽

Vol 17 (5) ◽

pp. 2191 ◽

Author(s):

O. Brox ◽

K. Iltgen ◽

S. Hellweg ◽

A. Benninghoven

Keyword(s):

Oxide Layer ◽

Layer Thickness ◽

Mass Spectroscopy ◽

Silicon Oxide ◽

Time Of Flight ◽

Oxide Layer Thickness ◽

Secondary Ion Mass Spectroscopy ◽

Silicon Oxide Layer ◽

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Ink identification by time-of-flight secondary ion mass spectroscopy

Surface and Interface Analysis ◽

10.1002/sia.2246 ◽

2006 ◽

Vol 38 (4) ◽

pp. 854-858 ◽

Author(s):

A. He ◽

D. Karpuzov ◽

S. Xu

Keyword(s):

Mass Spectroscopy ◽

Time Of Flight ◽

Secondary Ion Mass Spectroscopy ◽

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Surface structures of binary mixtures of imidazolium-based ionic liquids using high-resolution Rutherford backscattering spectroscopy and time of flight secondary ion mass spectroscopy

The Journal of Chemical Physics ◽

10.1063/1.4838376 ◽

2013 ◽

Vol 139 (22) ◽

pp. 224701 ◽

Author(s):

Kaoru Nakajima ◽

Motoki Miyashita ◽

Motofumi Suzuki ◽

Kenji Kimura

Keyword(s):

Ionic Liquids ◽

High Resolution ◽

Binary Mixtures ◽

Mass Spectroscopy ◽

Time Of Flight ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Surface Structures ◽

Secondary Ion Mass Spectroscopy ◽

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Physical and Chemical Characterization of Beryllium Particles from Several Workplaces in Québec, Canada—Part B: Time-of-flight Secondary-ion Mass Spectroscopy

Journal of Toxicology and Environmental Health Part A ◽

10.1080/15287390500192080 ◽

2005 ◽

Vol 68 (21) ◽

pp. 1907-1916 ◽

Author(s):

Mathieu Rouleau ◽

Joseph Zayed ◽

Chantal Dion ◽

Philippe Plamondon ◽

Gilles L'Espérance

Keyword(s):

Mass Spectroscopy ◽

Time Of Flight ◽

Chemical Characterization ◽

Secondary Ion Mass Spectroscopy ◽

Physical And Chemical Characterization ◽

Physical And Chemical ◽

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Revealing surface oxidation on the organic semi-conducting single crystal rubrene with time of flight secondary ion mass spectroscopy

Physical Chemistry Chemical Physics ◽

10.1039/c3cp50310k ◽

2013 ◽

Vol 15 (14) ◽

pp. 5202 ◽

Author(s):

Robert J. Thompson ◽

Sarah Fearn ◽

Ke Jie Tan ◽

Hans George Cramer ◽

Christian L. Kloc ◽

...

Keyword(s):

Single Crystal ◽

Mass Spectroscopy ◽

Time Of Flight ◽

Surface Oxidation ◽

Secondary Ion Mass Spectroscopy ◽

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Study of Asphaltene Adsorption on Kaolinite by X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectroscopy

Energy & Fuels ◽

10.1021/ef4001314 ◽

2013 ◽

Vol 27 (5) ◽

pp. 2465-2473 ◽

Author(s):

Shanshan Wang ◽

Qi Liu ◽

Xiaoli Tan ◽

Chunming Xu ◽

Murray R. Gray

Keyword(s):

Mass Spectroscopy ◽

Photoelectron Spectroscopy ◽

Time Of Flight ◽

Secondary Ion Mass Spectroscopy ◽

X Ray ◽

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Time-of-Flight Secondary Ion Mass Spectroscopy investigation of the chemical rearrangement undergone by MoS2 under tribological conditions

Thin Solid Films ◽

10.1016/j.tsf.2015.04.051 ◽

2015 ◽

Vol 588 ◽

pp. 67-77 ◽

Author(s):

G. Colas ◽

A. Saulot ◽

D. Philippon ◽

Y. Berthier ◽

D. Leonard

Keyword(s):

Mass Spectroscopy ◽

Time Of Flight ◽

Secondary Ion Mass Spectroscopy ◽

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