For yield measurement of an apple orchard or the mechanical harvesting of apples, there needs to be accurate identification of the target apple fruit. However, in a natural scene, affected by the apple’s growth posture and camera position, there are many kinds of apple images, such as overlapped apples; mutual shadows or leaves; stems; etc. It is a challenge to accurately locate overlapped apples. They will influence the positioning time and recognition efficiency and then affect the harvesting efficiency of apple-harvesting robots or the accuracy of orchard yield measurement. In response to this problem, an overlapped circle positioning method based on local maxima is proposed. First, the apple image is transformed into the Lab color space and segmented by the K-means algorithm. Second, some morphological processes, like erosion and dilation, are implemented to abstract the outline of the apples. Then image points are divided into central points; edge points; or outer points. Third, a fast algorithm is used to calculate every internal point’s minimum distance from the edge. Then, the centers of the apples are obtained by finding the maxima among these distances. Last, the radii are acquired by figuring out the minimum distance between the center and the edge. Thus, positioning is achieved. Experimental results showed that this method can locate overlapped apples accurately and quickly when the apple contour was complete; and this has certain practicability.
Reevaluating the Solution Photophysics of Tetraphenylethylene at the Origin of their Aggregation-Induced Emission Properties
