silicon epitaxy
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CrystEngComm ◽  
2020 ◽  
Vol 22 (33) ◽  
pp. 5464-5472
Author(s):  
Guillaume Noircler ◽  
Marta Chrostowski ◽  
Melvyn Larranaga ◽  
Etienne Drahi ◽  
Pere Roca i Cabarrocas ◽  
...  

Transmission electron microscopy techniques to better understand growth mechanisms and annealing of low temperature silicon epitaxy. HRTEM: thickness measurement, crystal morphology, and defect study. GPA (image processing): strain field analysis.



2019 ◽  
Vol 25 (8) ◽  
pp. 33-40
Author(s):  
Davide Moscatelli ◽  
Marco Dossi ◽  
Alessandro Fiorucci ◽  
Maurizio Masi


2019 ◽  
Vol 33 (6) ◽  
pp. 155-164
Author(s):  
Pierre Tomasini ◽  
Keith D. Weeks


2019 ◽  
Vol 93 (1) ◽  
pp. 37-40
Author(s):  
Evan M Anderson ◽  
Aaron M Katzenmeyer ◽  
Ting S Luk ◽  
DeAnna M Campbell ◽  
Michael T Marshall ◽  
...  


2019 ◽  
Vol 34 (2) ◽  
pp. 024001 ◽  
Author(s):  
Alexander Segal ◽  
Eugene Yakovlev ◽  
Denis Bazarevskiy ◽  
Roman Talalaev ◽  
Hocine Ziad ◽  
...  




2016 ◽  
Vol 378 ◽  
pp. 301-307 ◽  
Author(s):  
Xiao Deng ◽  
Pradeep Namboodiri ◽  
Kai Li ◽  
Xiqiao Wang ◽  
Gheorghe Stan ◽  
...  
Keyword(s):  


2016 ◽  
Vol 444 ◽  
pp. 21-27 ◽  
Author(s):  
Ramsey Hazbun ◽  
John Hart ◽  
Ryan Hickey ◽  
Ayana Ghosh ◽  
Nalin Fernando ◽  
...  


2016 ◽  
Vol 9 (5) ◽  
pp. 055506 ◽  
Author(s):  
Sheng Zhang ◽  
Ziyu Lu ◽  
Jiang Sheng ◽  
Pingqi Gao ◽  
Xi Yang ◽  
...  


Author(s):  
Ronan Leal ◽  
Jean-Christophe Dornstetter ◽  
Farah Haddad ◽  
Gilles Poulain ◽  
Jean-Luc Maurice ◽  
...  


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