atomic flux Recently Published Documents

Atomic flux circuits

Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II ◽

10.1117/12.2552585 ◽

2020 ◽

Author(s):

Douglas G. Bopp ◽

Ellyse Taylor ◽

Khoa Le ◽

Susan Schima ◽

Matthew Hummon ◽

...

Keyword(s):

Atomic flux distribution from a low-divergent dark wall oven

Review of Scientific Instruments ◽

10.1063/1.5090199 ◽

2019 ◽

Vol 90 (5) ◽

pp. 053202 ◽

Cited By ~ 3

Author(s):

Lakhi Sharma ◽

A. Roy ◽

S. Panja ◽

S. De

Keyword(s):

Flux Distribution ◽

Optimized atomic flux from a frequency-modulated two-dimensional magneto-optical trap for cold fermionic potassium atoms

Journal of the Optical Society of America B ◽

10.1364/josab.34.001415 ◽

2017 ◽

Vol 34 (7) ◽

pp. 1415 ◽

Author(s):

Jae Hoon Lee ◽

Jongchul Mun

Keyword(s):

Optical Trap ◽

Magneto Optical Trap ◽

Two Dimensional ◽

Effect of atomic flux reversal in a fluctuating moving optical lattice

Quantum Electronics ◽

10.1070/qel16349 ◽

2017 ◽

Vol 47 (5) ◽

pp. 451-454 ◽

Author(s):

D V Makarov

Keyword(s):

Optical Lattice ◽

Flux Reversal ◽

Direct observation of chiral currents and magnetic reflection in atomic flux lattices

Science Advances ◽

10.1126/sciadv.1602685 ◽

2017 ◽

Vol 3 (4) ◽

pp. e1602685 ◽

Cited By ~ 59

Author(s):

Fangzhao Alex An ◽

Eric J. Meier ◽

Bryce Gadway

Keyword(s):

Direct Observation ◽

Atomic Flux of Cu Diffusion into Sn During Interfacial Interactions Between Cu and Sn Nanoparticles

Journal of Electronic Materials ◽

10.1007/s11664-016-4957-8 ◽

2016 ◽

Vol 46 (1) ◽

pp. 602-608 ◽

Cited By ~ 2

Author(s):

Jagjiwan Mittal ◽

Kwang-Lung Lin

Keyword(s):

Interfacial Interactions ◽

Size-controlled bismuth nanoparticles physically grown by the support of cobalt atomic flux

Journal of Crystal Growth ◽

10.1016/j.jcrysgro.2015.09.029 ◽

2016 ◽

Vol 440 ◽

pp. 102-106 ◽

Author(s):

Ho Seok Lee ◽

Jin-Seo Noh

Keyword(s):

Bismuth Nanoparticles ◽

Atomic Flux ◽

Size Controlled

Atomic flux divergence-based AC electromigration model for signal line reliability assessment

2015 IEEE 65th Electronic Components and Technology Conference (ECTC) ◽

10.1109/ectc.2015.7159901 ◽

2015 ◽

Author(s):

Zhong Guan ◽

Malgorzata Marek-Sadowska

Keyword(s):

Reliability Assessment ◽

Flux Divergence ◽

Signal Line ◽

Incorporating Process Variations Into SRAM Electromigration Reliability Assessment Using Atomic Flux Divergence

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2015.2501900 ◽

2015 ◽

pp. 1-13 ◽

Cited By ~ 3

Author(s):

Zhong Guan ◽

Malgorzata Marek-Sadowska

Keyword(s):

Reliability Assessment ◽

Process Variations ◽

Flux Divergence ◽