2011 International Reliability Physics Symposium
Latest Publications

TOTAL DOCUMENTS

182
(FIVE YEARS 0)

H-INDEX

18
(FIVE YEARS 0)

Published By IEEE

9781424491131
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Formation of highly reliable Cu/low-k interconnects by using CVD Co barrier in dual damascene structures

2011 ◽  
Author(s):  
Hye Kyung Jung ◽  
Hyun-Bae Lee ◽  
Matsuda Tsukasa ◽  
Eunji Jung ◽  
Jong-Ho Yun ◽  
...  
Keyword(s):  
Dual Damascene ◽  
Low K

Investigation of the programming accuracy of a double-verify ISPP algorithm for nanoscale NAND Flash memories

2011 ◽  
Author(s):  
Carmine Miccoli ◽  
Christian Monzio Compagnoni ◽  
Alessandro S. Spinelli ◽  
Andrea L. Lacaita
Keyword(s):  
Nand Flash ◽  
Flash Memories

Oxide defects generation modeling and impact on BD understanding

2011 ◽  
Author(s):  
Y. Mamy Randriamihaja ◽  
V. Huard ◽  
A. Zaka ◽  
S. Haendler ◽  
X. Federspiel ◽  
...  
Keyword(s):  
Oxide Defects

Implantable microtechnologies for the brain: Challenges and strategies for reliable operation

2011 ◽  
Author(s):  
Jit Muthuswamy ◽  
Sindhu Anand ◽  
Jemmy Sutanto ◽  
Michael Baker ◽  
Murat Okandan
Keyword(s):  
Reliable Operation ◽  
The Brain ◽  
Challenges And Strategies

Re-investigation of gate oxide breakdown on logic circuit reliability

2011 ◽  
Author(s):  
Y.C. Huang ◽  
T.Y. Yew ◽  
W. Wang ◽  
Y.-H. Lee ◽  
R. Ranjan ◽  
...  
Keyword(s):  
Gate Oxide ◽  
Logic Circuit ◽  
Circuit Reliability ◽  
Oxide Breakdown

PBTI under dynamic stress: From a single defect point of view

2011 ◽  
Author(s):  
K. Zhao ◽  
J. H. Stathis ◽  
B. P. Linder ◽  
E. Cartier ◽  
A. Kerber
Keyword(s):  
Dynamic Stress ◽  
Point Of View ◽  
Single Defect

Impact of Source/Drain contact and gate finger spacing on the RF reliability of 45-nm RF nMOSFETs

2011 ◽  
Author(s):  
Rajan Arora ◽  
Sachin Seth ◽  
John Chung Hang Poh ◽  
John D. Cressler ◽  
Akil K. Sutton ◽  
...  
Load More ...
Sign in / Sign up

Export Citation Format

Share Document