2011 International Reliability Physics Symposium
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182
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18
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Published By IEEE

9781424491131
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

PBTI under dynamic stress: From a single defect point of view

2011 ◽  
Author(s):  
K. Zhao ◽  
J. H. Stathis ◽  
B. P. Linder ◽  
E. Cartier ◽  
A. Kerber
Keyword(s):  
Dynamic Stress ◽  
Point Of View ◽  
Single Defect

Impact of Source/Drain contact and gate finger spacing on the RF reliability of 45-nm RF nMOSFETs

2011 ◽  
Author(s):  
Rajan Arora ◽  
Sachin Seth ◽  
John Chung Hang Poh ◽  
John D. Cressler ◽  
Akil K. Sutton ◽  
...  

Investigation of the programming accuracy of a double-verify ISPP algorithm for nanoscale NAND Flash memories

2011 ◽  
Author(s):  
Carmine Miccoli ◽  
Christian Monzio Compagnoni ◽  
Alessandro S. Spinelli ◽  
Andrea L. Lacaita
Keyword(s):  
Nand Flash ◽  
Flash Memories

Oxide defects generation modeling and impact on BD understanding

2011 ◽  
Author(s):  
Y. Mamy Randriamihaja ◽  
V. Huard ◽  
A. Zaka ◽  
S. Haendler ◽  
X. Federspiel ◽  
...  
Keyword(s):  
Oxide Defects
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