2010 IEEE Workshop on Microelectronics and Electron Devices
Latest Publications

TOTAL DOCUMENTS

27

(FIVE YEARS 0)

H-INDEX

2

(FIVE YEARS 0)

Published By IEEE

9781424465729

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Continuous-Time/Discrete-Time (CT/DT) Cascaded Sigma-Delta Modulator for High Resolution and Wideband Applications

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453773 ◽

2010 ◽

Author(s):

Ali Mesgarani ◽

Khosrow H. Sadeghi ◽

Suat U. Ay

Keyword(s):

High Resolution ◽

Discrete Time ◽

Continuous Time ◽

Sigma Delta Modulator ◽

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Modified Floating Gate and IPD Profile for Better Cell Performance of Sub-50 nm NAND Flash Memory

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453752 ◽

2010 ◽

Author(s):

Jennifer Lequn Liu ◽

Fernando Gonzalez ◽

Y. Jeff Hu ◽

Jixin Yu ◽

Charan Srinivasan ◽

...

Keyword(s):

Flash Memory ◽

Floating Gate ◽

Cell Performance ◽

Nand Flash Memory

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chair message

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453762 ◽

2010 ◽

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Integration of a New Column-Parallel ADC Technology on CMOS Image Sensor

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453748 ◽

2010 ◽

Author(s):

Fan Z. Nelson ◽

Suat U. Ay

Keyword(s):

Cmos Image Sensor ◽

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Discrete Test Structure Device Degradation Analysis and Correlation to NAND Flash Circuit Operation

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453747 ◽

2010 ◽

Author(s):

Jasper Gibbons ◽

Puneet Sharma ◽

Steve Porter ◽

Jim Fulford ◽

Praveen Vaidyanathan ◽

...

Keyword(s):

Test Structure ◽

Degradation Analysis

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All Digital Multiplying DLL Using Precision Digital Delay Line as DCO

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453774 ◽

2010 ◽

Author(s):

Seong-Hoon Lee

Keyword(s):

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committee

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453761 ◽

2010 ◽

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Study of Carrier Mobility of Low-Energy, High-Dose Ion Implantations Using Continuous Anodic Oxidation Technique/Differential Hall Effect (CAOT/DHE) Measurements

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453751 ◽

2010 ◽

Author(s):

Shu Qin ◽

Y. Jeff Hu ◽

Allen McTeer ◽

Si Prussin ◽

Jason Reyes

Keyword(s):

Hall Effect ◽

Anodic Oxidation ◽

Carrier Mobility ◽

High Dose ◽

Anodic Oxidation Technique

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invited talk

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453766 ◽

2010 ◽

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Posters

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453771 ◽

2010 ◽

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