2010 IEEE Workshop on Microelectronics and Electron Devices
Latest Publications

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9781424465729

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Integration of a New Column-Parallel ADC Technology on CMOS Image Sensor

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453748 ◽

2010 ◽

Cited By ~ 2

Author(s):

Fan Z. Nelson ◽

Suat U. Ay

Keyword(s):

Cmos Image Sensor ◽

Image Sensor

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Continuous-Time/Discrete-Time (CT/DT) Cascaded Sigma-Delta Modulator for High Resolution and Wideband Applications

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453773 ◽

2010 ◽

Author(s):

Ali Mesgarani ◽

Khosrow H. Sadeghi ◽

Suat U. Ay

Keyword(s):

High Resolution ◽

Discrete Time ◽

Continuous Time ◽

Sigma Delta Modulator ◽

Sigma Delta

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Modified Floating Gate and IPD Profile for Better Cell Performance of Sub-50 nm NAND Flash Memory

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453752 ◽

2010 ◽

Author(s):

Jennifer Lequn Liu ◽

Fernando Gonzalez ◽

Y. Jeff Hu ◽

Jixin Yu ◽

Charan Srinivasan ◽

...

Keyword(s):

Flash Memory ◽

Floating Gate ◽

Cell Performance ◽

Nand Flash ◽

Nand Flash Memory

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chair message

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453762 ◽

2010 ◽

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Discrete Test Structure Device Degradation Analysis and Correlation to NAND Flash Circuit Operation

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453747 ◽

2010 ◽

Author(s):

Jasper Gibbons ◽

Puneet Sharma ◽

Steve Porter ◽

Jim Fulford ◽

Praveen Vaidyanathan ◽

...

Keyword(s):

Test Structure ◽

Nand Flash ◽

Degradation Analysis

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All Digital Multiplying DLL Using Precision Digital Delay Line as DCO

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453774 ◽

2010 ◽

Author(s):

Seong-Hoon Lee

Keyword(s):

Delay Line

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committee

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453761 ◽

2010 ◽

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Study of Carrier Mobility of Low-Energy, High-Dose Ion Implantations Using Continuous Anodic Oxidation Technique/Differential Hall Effect (CAOT/DHE) Measurements

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453751 ◽

2010 ◽

Author(s):

Shu Qin ◽

Y. Jeff Hu ◽

Allen McTeer ◽

Si Prussin ◽

Jason Reyes

Keyword(s):

Hall Effect ◽

Anodic Oxidation ◽

Carrier Mobility ◽

Low Energy ◽

High Dose ◽

Anodic Oxidation Technique

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invited talk

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453766 ◽

2010 ◽

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Posters

2010 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2010.5453771 ◽

2010 ◽

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2010 IEEE Workshop on Microelectronics and Electron DevicesLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Integration of a New Column-Parallel ADC Technology on CMOS Image Sensor

Continuous-Time/Discrete-Time (CT/DT) Cascaded Sigma-Delta Modulator for High Resolution and Wideband Applications

Modified Floating Gate and IPD Profile for Better Cell Performance of Sub-50 nm NAND Flash Memory

chair message

Discrete Test Structure Device Degradation Analysis and Correlation to NAND Flash Circuit Operation

All Digital Multiplying DLL Using Precision Digital Delay Line as DCO

committee

Study of Carrier Mobility of Low-Energy, High-Dose Ion Implantations Using Continuous Anodic Oxidation Technique/Differential Hall Effect (CAOT/DHE) Measurements

invited talk

Posters

2010 IEEE Workshop on Microelectronics and Electron Devices
Latest Publications