2006 International Symposium on VLSI Design, Automation and Test
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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

An Infrastructure IP for Repairing Multiple RAMs in SOCs

2006 International Symposium on VLSI Design, Automation and Test ◽

10.1109/vdat.2006.258150 ◽

2006 ◽

Cited By ~ 6

Author(s):

Chao-da Huang ◽

Tsu-wei Tseng ◽

Jin-fu Li

A Fully Integrated Spread Spectrum Clock Generator

2006 International Symposium on VLSI Design, Automation and Test ◽

10.1109/vdat.2006.258157 ◽

2006 ◽

Author(s):

Chao-chyun Chen ◽

Sheng-chou Lee ◽

Shen-iuan Liu

Keyword(s):

Spread Spectrum ◽

Clock Generator ◽

Fully Integrated

A VLSI Layout Legalization Technique Based on a Graph Fixing Algorithm

2006 International Symposium on VLSI Design, Automation and Test ◽

10.1109/vdat.2006.258148 ◽

2006 ◽

Cited By ~ 3

Author(s):

S. D. Wu ◽

Chun-chi Tsai ◽

Michael Yang

Keyword(s):

Vlsi Layout

Power-Gating Schemes for Ultra-Thin SOI (UTSOI) Circuits in Hybrid SOI-Epitaxial CMOS Structures

2006 International Symposium on VLSI Design, Automation and Test ◽

10.1109/vdat.2006.258120 ◽

2006 ◽

Author(s):

Shih-hsien Lo ◽

Koushik Das ◽

Ching-te Chuang ◽

Jeffrey Sleight

Keyword(s):

Power Gating

System Redundancy; A Means of Improving Process Variation Yield Degradation in Memory Arrays

2006 International Symposium on VLSI Design, Automation and Test ◽

10.1109/vdat.2006.258144 ◽

2006 ◽

Cited By ~ 8

Author(s):

Ahmed Eltawil ◽

Fadi Kurdahi

Keyword(s):

Process Variation ◽

Memory Arrays

A New Robust Paradigm for Diagnosing Hold-Time Faults in Scan Chains

2006 International Symposium on VLSI Design, Automation and Test ◽

10.1109/vdat.2006.258152 ◽

2006 ◽

Cited By ~ 11

Author(s):

Edward Hsu ◽

Shi-yu Huang ◽

Chao-wen Tzeng

Keyword(s):

Hold Time ◽

Scan Chains

Power-On Current Control In Sleep Transistor Implementations

2006 International Symposium on VLSI Design, Automation and Test ◽

10.1109/vdat.2006.258174 ◽

2006 ◽

Cited By ~ 5

Author(s):

David Howard ◽

Kaijian Shi

Keyword(s):

Current Control

A High-Speed Baseband Receiver for MIMO OFDM Based WLAN

2006 International Symposium on VLSI Design, Automation and Test ◽

10.1109/vdat.2006.258172 ◽

2006 ◽

Cited By ~ 1

Author(s):

Tsung-hsueh Lee ◽

Jing-siang Jhuang ◽

Tzi-dar Chiueh

Keyword(s):

High Speed ◽

Baseband Receiver ◽

Mimo Ofdm

A Power Efficient and Fast Transient Response Low Drop-Out Regulator in Standard CMOS Process

2006 International Symposium on VLSI Design, Automation and Test ◽

10.1109/vdat.2006.258163 ◽

2006 ◽

Cited By ~ 10

Author(s):

Chung-wei Lin ◽

Yen-jen Liu

Keyword(s):

Transient Response ◽

Drop Out ◽

Cmos Process ◽

Power Efficient ◽

Fast Transient Response ◽

Standard Cmos Process ◽

Fast Transient

An All-Digital Duty Cycle Corrector

2006 International Symposium on VLSI Design, Automation and Test ◽

10.1109/vdat.2006.258158 ◽

2006 ◽

Cited By ~ 6

Author(s):

Bo-jiun Chen ◽

Shao-ku Kao ◽

Shen-juan Liu

Keyword(s):

Duty Cycle

2006 International Symposium on VLSI Design, Automation and TestLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

An Infrastructure IP for Repairing Multiple RAMs in SOCs

A Fully Integrated Spread Spectrum Clock Generator

A VLSI Layout Legalization Technique Based on a Graph Fixing Algorithm

Power-Gating Schemes for Ultra-Thin SOI (UTSOI) Circuits in Hybrid SOI-Epitaxial CMOS Structures

System Redundancy; A Means of Improving Process Variation Yield Degradation in Memory Arrays

A New Robust Paradigm for Diagnosing Hold-Time Faults in Scan Chains

Power-On Current Control In Sleep Transistor Implementations

A High-Speed Baseband Receiver for MIMO OFDM Based WLAN

A Power Efficient and Fast Transient Response Low Drop-Out Regulator in Standard CMOS Process

An All-Digital Duty Cycle Corrector

2006 International Symposium on VLSI Design, Automation and Test
Latest Publications